Chinese Optics Letters, 2019, 17 (2): 020008, Published Online: Feb. 14, 2019  

Manipulating optical Tamm state in the terahertz frequency range with graphene Download: 738次

Author Affiliations
1 School of Physics and Electronics, Hunan Normal University, Changsha 410081, China
2 International Collaborative Laboratory of 2D Materials for Optoelectronic Science & Technology of Ministry of Education, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China
Figures & Tables

Fig. 1. Schematic diagram of the graphene–1D-PC composite structure. Incident light is assumed to be TM-polarized. Surface of the graphene layer is defined as the plane of z=0. Here, the period for the PC is T=20.

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Fig. 2. (a) Reflectance of the graphene–1D-PC configuration (solid line), reflection coefficient rGra for a graphene top-layer interface (dash dot line), and reflection coefficient rDBR for a top-layer PC interface (dash line) as functions of wavelength. For comparison, the reflectance of the configuration without the graphene layer is also shown (short dash line). (b) The phases of rGra (dash dot line), rDBR (short dash line), and rDBRrGrae2iϕ (solid line) as functions of wavelength. (c) The reflectance as a function of wavelength for different Fermi energies in the graphene–1D-PC composite configuration.

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Fig. 3. (a) Normalized electric field profile distributions in the multilayer configuration without the covering of a single graphene layer. (b) Normalized electric field profile distributions in the multilayer configuration with the covering of a single graphene layer.

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Fig. 4. (a) Dependence of the reflectance for the TM-polarized on wavelength and incident angle. (b) OTS dispersion characteristics on monolayer graphene for the TM-polarized. (c) Dependence of the reflectance for the TE-polarized on wavelength and incident angle. (d) OTS dispersion characteristics on monolayer graphene for the TE-polarized. Other parameters are the same as before.

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Fig. 5. (a) Reflectance as a function of wavelength at different dielectric constants of the top layer. (b) Reflectance as a function of wavelength at different thicknesses of the top layer. Other parameters have the same values as those in Fig. 2.

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Fig. 6. Reflectance as a function of wavelength at different numbers of layers; here, EF=1.0eV. Other parameters have the same values as those in Fig. 2.

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Leyong Jiang, Jiao Tang, Qingkai Wang, Yuexiang Wu, Zhiwei Zheng, Yuanjiang Xiang, Xiaoyu Dai. Manipulating optical Tamm state in the terahertz frequency range with graphene[J]. Chinese Optics Letters, 2019, 17(2): 020008.

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