CCD相机对14 MeV和2.5 MeV中子瞬态响应特性
[1] Janesick J. Scientific charge-coupled devices[M]. Washington: SPIE Press, 2001: 101-112.
[3] 王祖军, 唐本奇, 肖志刚, 等. CCD辐射损伤效应及加固技术研究进展[J]. 半导体光电, 2009, 30(6): 797-802.(Wang Zujun, Tang Benqi, Xiao Zhigang, et al. Progress of radiation damage effects and hardening technology on CCD. Semiconductor Optoelectronics, 2009, 30(6): 797-802)
[4] Yates G J, Turko B T. Circumvention of radiation-induced noise in CCD and CID imagers[J]. IEEE Trans on Nuclear Science, 1989, 36(6): 2214-2222.
[5] Yates G J, Smith G, Zagarino P, et al. Measuring neutron fluences and gamma/X-ray fluxes with CCD cameras[J]. IEEE Trans on Nuclear Science, 1992, 39(5): 1217-1225.
[6] Smith G W, Yates G J, Howorth J R, et al. Imaging with gated micro-channel plate intensifier camera systems in radiation environments[C]//Proc of SPIE. 1999, 3872: 148-159.
[7] Baggio J, Martinez M, D’hose C, et al. Analysis of transient effects induced by neutrons on a CCD image sensor[C]//Proc of SPIE. 2002, 4547: 105-115.
[8] Baggio J, D’hose C, Martinez M, et al. Transient noise in a CCD camera sensor induced by neutron and gamma irradiation[J]. Proc IEEE, 2002, 100: 186-191.
[9] Chugg A M, Hopkinson G. A new approach to modeling radiation noise in CCD’s[J]. IEEE Trans on Nuclear Science, 1998, 45(3): 1518-1523.
[10] Chugg A M, Jones R, Moutrie M J, et al. Analyses of CCD images of nucleon-silicon interaction events[J]. IEEE Trans on Nuclear Science, 2004, 51(5): 2851-2856.
[11] Duan Baojun, Hei Dongwei, Song Guzhou, et al. Study on transient noise of CCD camera induced by γ-ray[C]//Proc of SPIE. 2011: 81943D.
段宝军, 马继明, 宋顾周, 宋岩, 周鸣, 黑东炜, 韩长材, 姚志明. CCD相机对14 MeV和2.5 MeV中子瞬态响应特性[J]. 强激光与粒子束, 2014, 26(3): 034004. Duan Baojun, Ma Jiming, Song Guzhou, Song Yan, Zhou Ming, Hei Dongwei, Han Changcai, Yao Zhiming. Transient response of CCD cameras to 14 MeV and 2.5 MeV neutrons[J]. High Power Laser and Particle Beams, 2014, 26(3): 034004.