激光与光电子学进展, 2020, 57 (2): 021101, 网络出版: 2020-01-03
基于高通滤波鬼成像的边缘检测方法 
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Edge Detection Based on High-Pass Filter Ghost Imaging
图 & 表
图 3. “rice”的数值模拟边缘检测结果。(a) “rice”原图;(b) 40000次采样下CGI图像;(c) 40000次采样下CGI图像的边缘检测图;(d) 12000次采样下SSGI算法结果;(e) 12000次采样下Kirsch_max算法结果;(f) 12000次采样下Kirsch_ave算法结果;(g)原图边缘检测图
Fig. 3. Results of edge detection of “rice” using numerical simulation. (a) Original image of “rice”; (b) CGI image under 40000 samples; (c) edge detection image of CGI image under 40000 samples; (d) result of SSGI algorithm under 12000 samples; (e) result of Kirsch_max algorithm under 12000 samples; (f) result of Kirsch_ave algorithm under 12000 samples; (g) edge detection image of original image
图 5. 不同算法抗噪性分析。(a)不同算法结果图;(b)不同算法抗噪性能分析
Fig. 5. Analysis on anti-noise performances of different algorithms. (a) Results of different algorithms; (b) analysis on anti-noise performances of different algorithms
图 6. “lena”的数值模拟边缘检测结果。(a) “lena”原图;(b) 50000次采样下CGI图像;(c) 50000次采样下CGI图像的边缘检测图;(d) 12000次采样下SSGI算法结果;(e) 12000次采样下NSCT算法结果
Fig. 6. Results of edge detection of “lena” using numerical simulation. (a) Original image of “lena”; (b) CGI image under 50000 samples; (c) edge detection map of CGI image under 50000 samples; (d) result of SSGI algorithm under 12000 samples; (e) result of NSCT algorithm under 12000 samples
图 7. SSGI和本文算法边缘检测结果。(a)~(e)SSGI算法恢复图;(f)Sobel算子对原图的边缘检测图;(g)~(k)阈值TH为0时,基于NSCT的鬼成像方法的恢复图;(l)NSCT对原图的边缘检测图;(m)~(q)阈值TH为0.17时,基于NSCT的鬼成像方法的恢复图
Fig. 7. Results of edge detection of SSGI and proposed algorithms. (a)-(e)Recovery images of SSGI algorithm; (f) edge detection image of original image obtained by Sobel operator; (g)-(k) recovery images of NSCT based ghost imaging method when threshold TH is 0; (l) edge detection image of original image obtained by NSCT; (m)-(q) recovery images of NSCT based ghost imaging method when threshold TH is 0.17
陶勇, 王肖霞, 杨风暴. 基于高通滤波鬼成像的边缘检测方法[J]. 激光与光电子学进展, 2020, 57(2): 021101. Tao Yong, Wang Xiaoxia, Yang Fengbao. Edge Detection Based on High-Pass Filter Ghost Imaging[J]. Laser & Optoelectronics Progress, 2020, 57(2): 021101.
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