光学 精密工程, 2016, 24 (12): 3027, 网络出版: 2017-01-23  

大口径光学元件斜入射反射波前误差测量和计算

Measurement and calculation for reflective wavefront error of large optics at oblique incidence
作者单位
1 南京理工大学 电子工程与光电技术学院, 江苏 南京 210094
2 中国工程物理研究院, 四川 绵阳 621999
3 中国科学院 强激光材料重点实验室, 上海 201800
4 中国工程物理研究院 激光聚变研究中心, 四川 绵阳 621999
摘要
针对测量高功率激光驱动装置中大口径矩形反射光学元件的波前误差时测量角度和使用角度不完全相同引入的测量误差, 提出了将测量角度下的反射波前转换到使用角度的反射波前的换算及恢复方法。首先分析了将斜入射测量角度下的波前转换到使用角度下波前的余弦换算方法, 得到了实际测量角度与实际使用角度下的波前误差计算关系; 然后计算并分析了双三次插值算法本身引起的中频PSD1(功率谱密度)误差, 指出在满足有效口径测量的情况下, 选择的入射角度应该与实际使用的角度尽可能的相接近。最后, 基于410 mm×410 mm的熔石英反射镜开展了误差分析和实验验证。利用该方法将0°反射波前换算到45°反射波前, 并将得到的测试结果与45°直接测量得到的测试结果进行了比较。结果显示上述结果的PV值相差0.01λ, RMS值相差0.003λ, PSD1值相差0.08 nm; 表明该换算方法不仅能够准确计算出使用角度下反射波前的低频误差, 而且能获得相对准确的中频段PSD1误差。
Abstract
The difference between the measurement angle and the use angle will produce measuring errors when the wavefront errors of the large reflective optics in a high power driving device are measured. So this paper proposes a method to convert the reflection wavefront in a measuring angle into the reflection wavefront in a use angle. Firstly, the cosine conversion method used in conversing the wavefront in an oblique incidence angle into the wavefront in the use angle was analyzed, and the calculation relationship of the wavefront errors between actual measurement angle and actual use angle was obtained. Then, the mid-frequency PSD1 (Power Spectral Density) error caused by the third interpolation algorithm itself was calculated, and it points out that the selected incident angle should be close to that the actual use angle as much as possible when the measuring condition meets the effective diameter measurement. Finally, the error analysis and experimental verification were carried out based on a 410 mm ×410 mm fused quartz reflector.Using this method, the 0° reflection wavefront was convered into the 45° reflection wavefront, and the measuring result after conversion was compared with that of the direction measuring result at 45°. The compared results show that the differences of PV values, RMS values and the PSD1 values are 0.01 λ, 0.003 λ and 0.08 nm, respectively. These results indicate that the method not only can calculate exactly the low frequency errors of reflection wavefront, but also can obtain the PSD1 mid-frequency error.
参考文献

[1] WOLFE C R, LAWSON J K. The measurement and analysis of wavefront structure from large aperture ICF optics[R]. Office of Scientific & Technical Information Technical Reports, 1995, 2633:361-385.

[2] ENGLISH R E, LAUMANN C W, MILLER J L, et al.. Optical system design of the National Ignition Facility[C]. International Optical Design Conference, 1998,726.

[3] 许乔,顾元元,柴林, 等. 大口径光学元件波前功率谱密度检测[J]. 光学学报, 2001, 21(3):344-347.

    XU Q, GU Y Y, CHAI L, et al.. Measurement of wavefront power spectral density of large optical components[J].Acta Optica Sinica,2001,21(3):344-347. (in Chinese)

[4] LIU SH J, JIN CH X,ZHOU Y, et al.. Investigation on measurement of mid-frequency wavefront error for large optics in high-power laser system[C]. Conference on Optical Measurement System forIndustrial Inspection IX,2015.

[5] BAISDEN P A,ATHERTON L J,HAWLEY R A, et al.. Large optics for the national ignition facility [J]. Fusion Science and Technology,2016, 69: 295-351.

[6] 朱硕, 张晓辉. 误差分离技术在平面镜瑞奇-康芒法检测中的应用[J]. 光学 精密工程, 2014, 22(1):7-12.

    ZHU SH, ZHANG X H. Application of error detaching to Ritchey-Common test for flat mirrors [J]. Opt. Precision Eng.,2014, 22(1):7-12. (in Chinese)

[7] 朱硕, 张晓辉. 瑞奇-康芒式大口径平面镜面形数据处理方法对比研究[J]. 应用光学,2015, 36(5):698-704.

    ZHU SH, ZHANG X H. Comparative study on data processing method for large flat mirror in Ritchey-Common test[J]. Jounal of Applied Optics,2015,36(5):698-704. (in Chinese)

[8] 姜涛, 杨炜, 郭隐彪. 基于经验模态分解-Wigner分布的光学元件中频误差识别[J]. 强激光与粒子束,2014, 26(3):032003-1-032003-7.

    JIANG T, YANG W, GUO Y B, et al.. Mid-spatial frequency error identification of precision optical surface based on empirical mode decomposition-Wigner-Ville distribution[J]. High Power Laser and Partical Beams, 2014, 26(3):032003-1-032003-7. (in Chinese)

[9] de GROOT P. Principles of interference microscopy for the measurement of surface topography[J]. Advances in Optics and Photonics,2015, 7:1-65.

[10] 马春桃, 罗红心, 王劼,等.斜入射法检测平面反射镜的面形误差[J]. 激光与光电子学进展, 2011(7):071201-1-071201-7.

    MA CH T, LUO H X, WANG J, et al.. Surface error measurement of plane mirrors based on oblique incidence[J]. Laser&Optoelectronics Progress,2011(7):071201-1-071201-7. (in Chinese)

[11] 刘兆栋, 陈磊, 韩志刚. 斜入射干涉检测大口径碳化硅平面反射镜[J]. 光学 精密工程, 2011, 19(7):1437-1444.

    LIU ZH D, CHEN L, HAN ZH G. Measurement of large aperture SiC flat mirrors by oblique incidence interferometry[J]. Opt. Precision Eng.,2011, 19(7):1437-1444. (in Chinese)

[12] QU Y SH, TIAN W J, LI Y C, et al.. Improvement of the space resolution of the optical remote sensing image by the wavelet bi-cubic interpolation[J]. Acta Photonica Sinica, 2004, 33(5):601-604.

[13] 王会鹏, 周利莉, 张杰. 一种基于区域的双三次图像插值算法[J]. 计算机工程, 2010, 36(19):216-218.

    WANG H P, ZHOU L L, ZHANG J. Region-based bicubic image interpolation algorithm [J]. Computer Engineering, 2010, 36(19):216-218. (in Chinese)

徐隆波, 周游, 朱日宏, 刘世杰, 郑万国. 大口径光学元件斜入射反射波前误差测量和计算[J]. 光学 精密工程, 2016, 24(12): 3027. XU Long-bo, ZHOU You, ZHU Ri-hong, LIU Shi-jie, ZHENG Wan-guo. Measurement and calculation for reflective wavefront error of large optics at oblique incidence[J]. Optics and Precision Engineering, 2016, 24(12): 3027.

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