热带雨林环境中锗基底薄膜微缺陷对减反射膜环境稳定性的影响
王乔方, 任跃, 字正华, 王贵全, 刘剑, 张宏坤, 杨玉萍, 彭代东, 孙娟, 王茜. 热带雨林环境中锗基底薄膜微缺陷对减反射膜环境稳定性的影响[J]. 红外技术, 2016, 38(12): 1073.
WANG Qiaofang, REN Yue, ZI Zhenghua, WANG Guiquan, LIU Jian, ZHANG Hongkun, YANG Yuping, PENG Daidong, SUN Juan, WANG Qian. Influence of the Micro Defect on the Stability of Ge-base Antireflective Films in Tropical Rainforest Environment[J]. Infrared Technology, 2016, 38(12): 1073.
[1] 余怀之. 红外光学材料[M].北京: 国防工业出版社, 2007, 149-150.
YU Huaizhi. Infrared Optical Material[M]. Beijing: National Defense Industry Press, 2007, 149-150.
[2] 张耀平, 许鸿, 凌宁, 等. YbF3沉积速率对红外激光薄膜表面缺陷的影响[J].强激光与粒子束, 2005, 17(7): 1019-1022.
[3] 张东平, 齐红基, 方明, 等. 微缺陷对薄膜滤光片环境稳定性的影响[J].光子学报, 2005, 34(6): 873-877.
[4] 中国兵器工业标准化研究所. GJB2485-95光学膜层通用规范[S].北京: 中国兵器工业标准化研究所, 1995-10-16.
Institute of China Ordnance Industry Standardization. GJB2485-95 General specification for optical coating[S]. Beijing: Institute of China Ordnance Industry Standardization, 1995-10-16.
[5] 陈凤金, 苏现军, 马胜昔, 等. 湿热环境对 Ge基中波减反射膜可靠性的影响[J].应用光学, 2015, 36(1): 94-97.
CHEN Fengjin, SU Xianjun, MA Shengxi, et al. Reliability of Ge-based MW antireflective films in hygrothermal environment[J]. Journal of Applied Optics, 2015, 36(1): 94-97.
[6] 唐晋发, 顾培夫, 刘旭, 等. 现代光学薄膜技术[M].杭州: 浙江大学出版社, 2006: 433.
TANG Jinfa, GU Peifu, LIU Xu, et al. Model Optical Thin Film Technology[M]. Hangzhou: Zhejiang University Press, 2006: 433.
[7] 郭培涛, 薛亦渝, 赵立新, 等. 多层光学薄膜缺陷的形貌及成分[J].中国激光, 2009, 36(6): 360-363.
GUO Peitao, XUE Yiyu, ZHAO Lixin, et al. Morphological and composition of defects of optical coatings[J]. Chinese Journal of Lasers, 2009, 36(6): 360-363.
[8] 王乔方, 字正华, 李汝劼, 等. 红外 Ge窗口在热带雨林环境中的腐蚀特性研究[J].红外技术, 2014, 36(12): 964-966.
王乔方, 任跃, 字正华, 王贵全, 刘剑, 张宏坤, 杨玉萍, 彭代东, 孙娟, 王茜. 热带雨林环境中锗基底薄膜微缺陷对减反射膜环境稳定性的影响[J]. 红外技术, 2016, 38(12): 1073. WANG Qiaofang, REN Yue, ZI Zhenghua, WANG Guiquan, LIU Jian, ZHANG Hongkun, YANG Yuping, PENG Daidong, SUN Juan, WANG Qian. Influence of the Micro Defect on the Stability of Ge-base Antireflective Films in Tropical Rainforest Environment[J]. Infrared Technology, 2016, 38(12): 1073.
PDF全文
