热带雨林环境中锗基底薄膜微缺陷对减反射膜环境稳定性的影响

The method of sample test was taken, in which infrared antireflective films samples were deposited on Ge substrate, and samples were tested in tropical rainforest environment in Xishuangbanna. By using FT-IR spectrometer and SEM, the characteristics of samples before and after the experiment was analyzed. The stability of samples in tropical rainforest environment was studied. The experiment results show that the corrosion and expansion from micro defect sites in the films are one of the main influence factors for the failure of the films in the tropical rain forest.

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王乔方, 任跃, 字正华, 王贵全, 刘剑, 张宏坤, 杨玉萍, 彭代东, 孙娟, 王茜. 热带雨林环境中锗基底薄膜微缺陷对减反射膜环境稳定性的影响[J]. 红外技术, 2016, 38(12): 1073. WANG Qiaofang, REN Yue, ZI Zhenghua, WANG Guiquan, LIU Jian, ZHANG Hongkun, YANG Yuping, PENG Daidong, SUN Juan, WANG Qian. Influence of the Micro Defect on the Stability of Ge-base Antireflective Films in Tropical Rainforest Environment[J]. Infrared Technology, 2016, 38(12): 1073.

热带雨林环境中锗基底薄膜微缺陷对减反射膜环境稳定性的影响

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