基于改进 ANFIS的绝缘子紫外光斑评估方法
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徐国辉, 谢宏伟, 吕通发, 牟鑫, 鲍明正, 吕超. 基于改进 ANFIS的绝缘子紫外光斑评估方法[J]. 红外技术, 2023, 45(12): 1346. XU Guohui, XIE Hongwei, LYU Tongfa, MOU Xin, BAO Mingzheng, LYU Chao. Assessment Method of Ultraviolet Spot Area for Insulators Based on Improved ANFIS[J]. Infrared Technology, 2023, 45(12): 1346.