Surface characterization of ICF capsule by  AFM-based profilometer

Jie Meng; Xuesen Zhao; Xing Tang; Yihao Xia; Xiaojun Ma; Dangzhong Gao

doi:doi:10.1017/hpl.2017.20

High Power Laser Science and Engineering, 2017, 5 (3): 03000e21, Published Online: Nov. 21, 2018

Surface characterization of ICF capsule by AFM-based profilometer Download： 535次

Jie Meng ¹Xuesen Zhao ²Xing Tang ¹Yihao Xia ¹Xiaojun Ma ¹Dangzhong Gao ^1,†

Author Affiliations

¹ Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China

² P.O.Box 413, Harbin Institute of Technology, Harbin 150001, PR China

Figures & Tables

Fig. 8. Traces (a) before and (b) after capsule repositioning of $360^{\circ }$.

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Fig. 9. Noise power spectra.

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Fig. 10. Orbits covering the complete surface.

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Fig. 11. Surface reconstruction with different orders.

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Fig. 12. (a) Surface profile traces and (b) corresponding 1D mode-power spectrum.

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Fig. 13. 2D power spectrum curve.

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Fig. 14. Power spectrum curves with (a) good surface quality and (b) bad surface quality.

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Jie Meng, Xuesen Zhao, Xing Tang, Yihao Xia, Xiaojun Ma, Dangzhong Gao. Surface characterization of ICF capsule by AFM-based profilometer[J]. High Power Laser Science and Engineering, 2017, 5(3): 03000e21.

Surface characterization of ICF capsule by AFM-based profilometer Download： 535次

Fig. 1. Schematic of capsule profilometer setup.

Fig. 2. Photo of capsule profilometer.

Fig. 3. CCD video shots during measurement.

Fig. 4. The process steps of capsule center alignment.

Fig. 5. AFM tip and capsule.

Fig. 6. Measured surface traces in one orbit.

Fig. 7. Trace patterns for capsule measurement.

Fig. 8. Traces (a) before and (b) after capsule repositioning of $360^{\circ }$.

Fig. 9. Noise power spectra.

Fig. 10. Orbits covering the complete surface.

Fig. 11. Surface reconstruction with different orders.

Fig. 12. (a) Surface profile traces and (b) corresponding 1D mode-power spectrum.

Fig. 13. 2D power spectrum curve.

Fig. 14. Power spectrum curves with (a) good surface quality and (b) bad surface quality.

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Surface characterization of ICF capsule by AFM-based profilometer Download： 535次

Fig. 1. Schematic of capsule profilometer setup.

Fig. 2. Photo of capsule profilometer.

Fig. 3. CCD video shots during measurement.

Fig. 4. The process steps of capsule center alignment.

Fig. 5. AFM tip and capsule.

Fig. 6. Measured surface traces in one orbit.

Fig. 7. Trace patterns for capsule measurement.

Fig. 8. Traces (a) before and (b) after capsule repositioning of $360^{\circ }$.

Fig. 9. Noise power spectra.

Fig. 10. Orbits covering the complete surface.

Fig. 11. Surface reconstruction with different orders.

Fig. 12. (a) Surface profile traces and (b) corresponding 1D mode-power spectrum.

Fig. 13. 2D power spectrum curve.

Fig. 14. Power spectrum curves with (a) good surface quality and (b) bad surface quality.

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