基于加速退化数据的金属化膜脉冲电容器可靠性分析
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赵建印, 孙权, 周经伦, 贺少勃, 魏晓峰. 基于加速退化数据的金属化膜脉冲电容器可靠性分析[J]. 强激光与粒子束, 2006, 18(9): 1495. 赵建印, 孙权, 周经伦, 贺少勃, 魏晓峰. Failure analysis of metallized film pulse capacitors based on accelerated degradation data[J]. High Power Laser and Particle Beams, 2006, 18(9): 1495.