光电技术应用, 2015, 30 (6): 26, 网络出版: 2016-01-20  

典型工艺缺陷对光波导特性的影响研究

Research on Effect of Typical Process Defect on Optical Waveguide Characteristic
作者单位
1 北京交通大学 理学院 发光与光信息技术教育部重点实验室, 北京 100044
2 光信息科学与技术研究所, 北京 100044
引用该论文

范哲珲, 王健. 典型工艺缺陷对光波导特性的影响研究[J]. 光电技术应用, 2015, 30(6): 26.

FAN Zhe-hui, WANG Jian. Research on Effect of Typical Process Defect on Optical Waveguide Characteristic[J]. Electro-Optic Technology Application, 2015, 30(6): 26.

参考文献

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范哲珲, 王健. 典型工艺缺陷对光波导特性的影响研究[J]. 光电技术应用, 2015, 30(6): 26. FAN Zhe-hui, WANG Jian. Research on Effect of Typical Process Defect on Optical Waveguide Characteristic[J]. Electro-Optic Technology Application, 2015, 30(6): 26.

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