[1] . Document identification for copyright protection using centroid detection[J]. IEEE Transactions on Communications, 1998, 46(3): 372-383.

[2] . . Integration of a photodiode array and centroid processing on a single CMOS chip for a real-time Shack-Hartmann wavefront sensor[J]. IEEE Sensors J., 2004, 4(6): 787-794.

[3] Liu Zhi, Zhai Linpei, Hao Zhihang. Sub-pixel measurement accuracy experiment of complementary metal oxide semiconductor imager[J]. Chin. J. Lasers, 2007, 34(1): 116～122
刘智, 翟林培, 郝志航. 互补金属氧化物半导体图像传感器亚像元细分精度实验研究[J]. 中国激光, 2007, 34(1): 116～122

[4] Chen Li, Yu Xin. Study on Hartmann-Shack wavefront sensor subaperture mergence[J]. Acta Optica Sinica, 2000, 20(12): 1585～1590
陈笠, 俞信. 哈特曼-夏克波前传感器子孔径合并的理论研究[J]. 光学学报, 2000, 20(12): 1585～1590

[5] Li Jun, Chen Haiqing, Ren Wenxin et al.. Improvement of the robustness of Hartmann wavefront sensor by using Zernike moment[J]. Chin. J. Lasers, 2006, 33(8): 1033～1037
李俊, 陈海清, 任温馨 等. Zernike 矩提高哈特曼波前传感器的鲁棒性[J]. 中国激光, 2006, 33(8): 1033～1037

[6] Cox M G, Harris P M. Best practice guide No.6: uncertainty and statistical modelling[Z]. Teddington: National Physical Laboratory, 2004

[7] De Santo M, Liguori C, Paolillo A et al.. Standard uncertainty evaluation in image-based measurements[J]. Meas. J. Int. Meas. Confed, 2004, 36(3～4): 347～358

[8] . Monte-Carlo analysis of centroid detected accuracy for wavefront sensor[J]. Opt. Laser Technol., 2005, 37(7): 541-546.

[9] . Analysis of temporal noise in CMOS photodiode active pixel sensor[J]. IEEE J. Solid State Circuits, 2001, 36(1): 92-101.

[10] Matt Steele R, Jaynes C. Feature uncertainty arising from covariant image noise[C]. Proc. IEEE Comput. Soc. Conf. Comput. Vision Pattern Recognition,Piscataway, 2005. 1063～1070

[11] . Uncertainty characterization in image-based measurements: a preliminary discussion[J]. IEEE Trans. Instrum. Meas., 2000, 49(5): 1101-1107.

[12] De Santo M, Liguori C, Pietrosanto A. Uncertainty in image based measurements: A step towards model characterization[C]. Proc. IEEE Instrum. Meas. Technol. Conf., Piscataway, 2000, (1): 365～369

[13] . Minimum variance centroid thresholding[J]. Opt. Lett., 2002, 27(7): 497-499.