Chinese Optics Letters, 2019, 17 (11): 113101, Published Online: Sep. 12, 2019   

Effect of annealing on the damage threshold and optical properties of HfO2/Ta2O5/SiO2 high-reflection film Download: 959次

Author Affiliations
State Key Laboratory of High-Power Semiconductor Laser, Changchun University of Science and Technology, Changchun 130022, China
Basic Information
DOI: 10.3788/COL201917.113101
中图分类号: --
栏目: Thin films
项目基金: This work was supported by the Jilin Science and Technology Development Plan (Nos. 20180519018JH and 20190302052GX), the Jilin Education Department “135” Science and Technology (No. JJKH20190543KJ), the National Natural Science Foundation of China (No. 11474038), and the Excellent Youth Foundation of Jilin Province (No. 20180520194JH).
收稿日期: May. 7, 2019
修改稿日期: --
网络出版日期: Sep. 12, 2019
通讯作者: Jie Fan (fanjie@cust.edu.cn)
备注: --

Jianing Dong, Jie Fan, Sida Mao, Yunping Lan, Yonggang Zou, Haizhu Wang, Jiabin Zhang, Xiaohui Ma. Effect of annealing on the damage threshold and optical properties of HfO2/Ta2O5/SiO2 high-reflection film[J]. Chinese Optics Letters, 2019, 17(11): 113101.

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