光学学报, 1983, 3 (6): 573, 网络出版: 2011-09-15
再论测量高斯光斑参数的调制盘方法
Re-discussion on the reticle method for measuring the parameters of Gaussian optical spot
补充材料
尹达人, 许生龙. 再论测量高斯光斑参数的调制盘方法[J]. 光学学报, 1983, 3(6): 573. YIN DAREN, XU SHENLONG. Re-discussion on the reticle method for measuring the parameters of Gaussian optical spot[J]. Acta Optica Sinica, 1983, 3(6): 573.