中国激光, 1992, 19 (10): 785, 网络出版: 2007-09-11
透明介质的厚度与折射率的测量
Measurement of thickness and index of refraction of transparent medium
摘要
用激光散斑照相的方法测量了因光在透明介质中折射而引起的散斑位移,并求出介质的厚度与折射率。测量范围较大,最小厚度为微米。
Abstract
By means of laser speckle photography, the speckle displacement caused by refra ction in transparent medium is measured. The thickness and the index of refraction is then calcu lated. The measured range is wide and the thickness precision is up to the level of micrometer.
参考文献
赵德信, 宋伟. 透明介质的厚度与折射率的测量[J]. 中国激光, 1992, 19(10): 785. 赵德信, 宋伟. Measurement of thickness and index of refraction of transparent medium[J]. Chinese Journal of Lasers, 1992, 19(10): 785.
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