Frontiers of Optoelectronics, 2017, 10 (3): 308, 网络出版: 2018-01-17  

Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions

Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions
作者单位
1 Taras Shevchenko National University of Kyiv, Faculty of Radio Physics, Electronics, and Computer Systems, Vladimirskaya str. 64, 01033 Kiev, Ukraine
2 Lomonosov Moscow State University, Department of Physics and International Laser Center, Vorobiovy Gory, 119992 Moscow, Russia
3 Oklahoma State University, Department of Physics, 145 Physical Sciences Building, Stillwater, Oklahoma 74078, USA
摘要
Abstract
Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed.<作者简介Sergey Savenkov obtained his Ph.D. and Sc.D. degrees from Taras Shevchenko National University of Kyiv (Ukraine) in 1996 and 2013, respectively. Since 1986, Dr. Savenkov has been a researcher at the Faculty of Radio Physics, Electronics, and Computer Systems, Taras Shevchenko National University of Kyiv (Ukraine). His areas of scientific interest include laser polarimetry, polarimetry of anisotropic and depolarized media, and biomedical optics.

Sergey SAVENKOV, Alexander V. PRIEZZHEV, Yevgen OBEREMOK, Sergey SHOLOM, Ivan KOLOMIETS. Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions[J]. Frontiers of Optoelectronics, 2017, 10(3): 308. Sergey SAVENKOV, Alexander V. PRIEZZHEV, Yevgen OBEREMOK, Sergey SHOLOM, Ivan KOLOMIETS. Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions[J]. Frontiers of Optoelectronics, 2017, 10(3): 308.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!