Realization of absolute negative refraction index by a photonic crystal using anisotropic dielectric material

Yuntuan Fang; Zhengbiao Ouyang

Chinese Optics Letters, 2008, 6 (1): 0157, Published Online: Jan. 29, 2008

Realization of absolute negative refraction index by a photonic crystal using anisotropic dielectric material Download： 619次

论文大纲

Yuntuan Fang Zhengbiao Ouyang

Author Affiliations

Department of Physics, Zhenjiang Watercraft College, Zhenjiang 2120032THz-Technology Research Center of Shenzhen University, Shenzhen 5180603Shenzhen Key Laboratory of Micro-Nano-Photonic Information Technology, Shenzhen 5180604College of Electronic Science and Technology of Shenzhen University, Shenzhen 518060

光子晶体绝对负折射率各向异性成像 250.0250 Optoelectronics 160.4670 Optical materials 260.1180 Crystal optics 110.2990 Image formation theory

Abstract

A method to realize absolute negative refraction index [EQUATION] with a two-dimensional (2D) photonic crystal is presented by introducing dielectric anisotropy in the photonic crystal material. The band structures of E-polarization mode and H-polarization mode can be adjusted by changing the parameters of materials. Thus the two modes with different polarizations have the same negative refraction index [EQUATION] for the same frequency. The results are demonstrated by numerical simulation based on the finite-difference time-domain (FDTD) method.

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Yuntuan Fang, Zhengbiao Ouyang. Realization of absolute negative refraction index by a photonic crystal using anisotropic dielectric material[J]. Chinese Optics Letters, 2008, 6(1): 0157.

Realization of absolute negative refraction index by a photonic crystal using anisotropic dielectric material Download： 619次

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