强吸收衬底上薄膜厚度和折射率的测量新方法
[1] . The optical methods for measuring the thickness and refractive index of thin films[J]. Modern Scientific Instruments, 2003, 4: 42-44.
[2] . E. Aspnes, A. A. Studna. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV[J]. Phys. Rev. B, 1983, 27(2): 985-1004.
[3] . . Free-space coupling of a light beam into a symmetrical metal-cladding optical waveguide[J]. Appl. Phys. Lett., 2003, 83(14): 2757-2759.
[4] Shen Xuechu. Semiconducter Spectra and Optical Properties [M]. 2rd edition. Beijing: Science Press, 2002
沈学础. 半导体光谱和光学性质[M]. 第二版. 北京:科学出版社,2002
[5] . P. Chen, J. M. Chen. Use of surface plasma waves for determination of the thickness and optical constants of thin metallic films[J]. J. Opt. Soc. Am., 1981, 71(2): 189-191.
[6] . G. Schulz, F. R. Tancherlini. Optical constants of silver, gold, copper, and aluminum. Ⅱ. The index of refraction n[J]. J. Opt. Soc. Am., 1954, 44(5): 362-368.
[7] . G. Schulz. Optical constants of silver, gold, copper, and aluminum. Ⅰ. The absorption coefficient k[J]. J. Opt. Soc. Am., 1954, 44(5): 357-362.
[8] . . Improved attenuated-total-reflection technique for measuring the electro-optic coefficients of nonlinear optical polymers[J]. J. Opt. Soc. Am. B, 2000, 17(5): 805-808.
张竞, 曹庄琪, 陆海峰, 李红根, 沈启舜. 强吸收衬底上薄膜厚度和折射率的测量新方法[J]. 中国激光, 2006, 33(7): 959. 张竞, 曹庄琪, 陆海峰, 李红根, 沈启舜. New Measurement Method of Thickness and Refractive Index of the Film Grown on the Strong Absorption Substrate[J]. Chinese Journal of Lasers, 2006, 33(7): 959.