Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures

Zhixin Liu; Meiling Jiang; Yanglin Hu; Feng Lin; Bo Shen; Xing Zhu; Zheyu Fang

doi:doi:10.29026/oea.2018.180007

Opto-Electronic Advances, 2018, 1 (4): 180007, Published Online: Mar. 19, 2019

Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures

Zhixin Liu Meiling Jiang Yanglin Hu Feng Lin Bo Shen Xing Zhu Zheyu Fang ^*

Author Affiliations

School of Physics, State Key Lab for Mesoscopic Physics, Academy for Advanced Interdisciplinary Studies, Collaborative Innovation Center of Quantum Matter, Peking University, Beijing 100871, China

Basic Information

DOI:	10.29026/oea.2018.180007
中图分类号:	--
栏目:
项目基金:	--
收稿日期:	Apr. 17, 2018
修改稿日期:	--
网络出版日期:	Mar. 19, 2019
通讯作者:	Zheyu Fang (zhyfang@pku.edu.cn)
备注:	--

Zhixin Liu, Meiling Jiang, Yanglin Hu, Feng Lin, Bo Shen, Xing Zhu, Zheyu Fang. Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures[J]. Opto-Electronic Advances, 2018, 1(4): 180007.