Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures | Opto-Electronic Advances -- 中国光学期刊网

Opto-Electronic Advances, 2018, 1 (4): 180007, Published Online: Mar. 19, 2019

Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures

Zhixin Liu Meiling Jiang Yanglin Hu Feng Lin Bo Shen Xing Zhu Zheyu Fang ^*

Author Affiliations

School of Physics, State Key Lab for Mesoscopic Physics, Academy for Advanced Interdisciplinary Studies, Collaborative Innovation Center of Quantum Matter, Peking University, Beijing 100871, China

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Zhixin Liu, Meiling Jiang, Yanglin Hu, Feng Lin, Bo Shen, Xing Zhu, Zheyu Fang. Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures[J]. Opto-Electronic Advances, 2018, 1(4): 180007.

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Zhixin Liu, Meiling Jiang, Yanglin Hu, Feng Lin, Bo Shen, Xing Zhu, Zheyu Fang. Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures[J]. Opto-Electronic Advances, 2018, 1(4): 180007.

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