基于耗损失效模型的金属化膜脉冲电容器可靠性评估
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赵建印, 刘芳, 孙权, 周经伦, 魏晓峰, 贺少勃. 基于耗损失效模型的金属化膜脉冲电容器可靠性评估[J]. 强激光与粒子束, 2005, 17(7): 1031. ZHAO Jian-yin, LIU Fang, SUN Quan, ZHOU Jing-lun, WEI Xiao-feng, HE Shao-bo. Reliability assessment of metallized film capacitors using degradation failure model[J]. High Power Laser and Particle Beams, 2005, 17(7): 1031.