确定光子晶体光纤方位角的散射图案特征法

为了满足加工和制作光子晶体光纤器件时的方位角定位需求，提出基于激光前向散射图案的方位角确定方法。用波长为650nm的激光垂直照射在光子晶体光纤的侧面，拍摄前向散射图案同时实时记录光子晶体光纤端面的显微图像。选取前向散射图案的局部区域强度之和为特征值，通过比较分析得出当求取前向散射图案半幅散射条纹强度值总和时，其特征值变化规律与光子晶体光纤内部轴向结构相对应，可用于光子晶体光纤特殊方位角的确定。在三种不同结构的光子晶体光纤的特殊方位角定位中，该方法的定位精度均小于0.5°，充分证实了该方法的有效性和普适性。提出的光子晶体光纤轴向特殊方位角确定方法简单实用、定位精确，将在光子晶体光纤器件加工中发挥重要的作用。

Abstract

In order to meet the requirement of determining the azimuth angles in fabricating optical devices from photonic crystal fibers (PCFs), a method based on analyzing the forward scattering patterns is proposed. The PCF sample is illuminated transversely by a laser of 650 nm, and the forward scattering patterns and the tip microscopic images are simultaneously recorded. The summary of local intensities of the forward scattering patterns is chosen as the characteristic value. The characteristic value presents good correspondence to the azimuth angles of photonic crystal fiber by comparing the half-image summarized intensities of the forward scattering patterns. Based on this correspondence, the special azimuth angle can be determined. The accuracy within 0.5° obtained in the applications to three kinds of PCFs proves that the proposed method is effective and universal. This method is simple in operation, accurate in determination, and is expected to play an important role in the axial orientation in the fabrication of PCF based devices.

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