利用光散射特性研究光学表面中瑞利缺陷粒子的方位诊断
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巩蕾, 吴振森, 潘永强. 利用光散射特性研究光学表面中瑞利缺陷粒子的方位诊断[J]. 光子学报, 2014, 43(8): 0831003. GONG Lei, WU Zhen-sen, PAN Yong-qiang. The Diagnosis of Rayleigh Defect Particle Position by Light Scattering Character on the Optical Surface[J]. ACTA PHOTONICA SINICA, 2014, 43(8): 0831003.