强激光与粒子束, 2007, 19 (8): 1287, 网络出版: 2008-02-18   

相移光腔衰荡高反射率测量中的拟合方法

Fitting method for high reflectivity measurement with phase-shift cavity ring-down technique
作者单位
1 中国科学院,光电技术研究所,成都,610209
2 中国科学院,研究生院,北京,100039
摘要
分析了相移光腔衰荡技术中由锁相放大器探测光腔输出信号一次谐波的振幅和相位随调制频率的变化曲线.拟合结果发现,联合幅频和相频曲线构造同时含有振幅和相位信息的均方差拟合函数,不同频率拟合范围得到的衰荡时间平均值为0.791 μs,最大误差由分别用幅频或相频曲线拟合得到的衰荡时间误差的8%减小到1.3%,均方差仅为0.5%.通过在拟合函数中加入系统响应时间、系统初始相位等参数,避免了相移光腔衰荡中直腔实验时测量系统频率响应曲线,提高了测量精度.
Abstract
参考文献

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龚元, 李斌成. 相移光腔衰荡高反射率测量中的拟合方法[J]. 强激光与粒子束, 2007, 19(8): 1287. 龚元, 李斌成. Fitting method for high reflectivity measurement with phase-shift cavity ring-down technique[J]. High Power Laser and Particle Beams, 2007, 19(8): 1287.

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