量子电子学报, 2017, 34 (3): 374, 网络出版: 2017-06-09
基于后焦面成像的聚合物平面波导光学参数测量仪
Polymer planar waveguide parameter measuring instrument based on back focal plane imaging
基本信息
| DOI: | 10.3969/j.issn.1007-5461. 2017.03.017 |
| 中图分类号: | TN252 |
| 栏目: | 波导与纤维光学 |
| 项目基金: | Supported by National Natural Science Foundation of China (国家自然科学基金, 11374286, 61427818), National Key Basic Research Program of China (国家科技部973项目, 2013CBA01703), Science and Technological Fund of Anhui Province for Outstanding Youth (安徽省杰青青年科学基金, 1608085J02) |
| 收稿日期: | 2016-02-25 |
| 修改稿日期: | 2016-04-13 |
| 网络出版日期: | 2017-06-09 |
| 通讯作者: | |
| 备注: | -- |
. 基于后焦面成像的聚合物平面波导光学参数测量仪[J]. 量子电子学报, 2017, 34(3): 374. . Polymer planar waveguide parameter measuring instrument based on back focal plane imaging[J]. Chinese Journal of Quantum Electronics, 2017, 34(3): 374.
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