量子电子学报, 2017, 34 (3): 374, 网络出版: 2017-06-09
基于后焦面成像的聚合物平面波导光学参数测量仪
Polymer planar waveguide parameter measuring instrument based on back focal plane imaging
知识挖掘
. 基于后焦面成像的聚合物平面波导光学参数测量仪[J]. 量子电子学报, 2017, 34(3): 374. . Polymer planar waveguide parameter measuring instrument based on back focal plane imaging[J]. Chinese Journal of Quantum Electronics, 2017, 34(3): 374.