强激光与粒子束, 2014, 26 (6): 063012, 网络出版: 2014-06-03   

高功率微波介质窗表面电子倍增二维粒子模拟

Two dimensional particle-in-cell simulation of electron multipactor on high power microwave dielectric window surface
作者单位
电子物理与器件教育部重点实验室(西安交通大学), 西安 710049
摘要
基于第一性原理的粒子模拟方法,对高功率微波器件中介质窗表面电子实际形成和发展的变化情况进行了研究。使用VORPAL粒子模拟软件,建立一个简单的TEM波垂直入射介质窗表面的二维模型,采用Vaughan二次电子发射模型,利用蒙特卡罗碰撞方法处理电子与背景气体之间的弹性碰撞、激发碰撞和电离碰撞,获得了介质窗表面电子倍增的图像。模拟结果表明,介质窗表面电子数量在一定的时间内达到饱和状态,其振荡频率是入射射频电场频率的两倍。改变初始发射种子电子的数量、入射射频电场的幅值以及背景气体的压强等关键性参数,可得到不同条件下介质窗表面电子数量的变化规律。
Abstract
Based on the particle-in-cell (PIC) simulation method of the first principle, this paper studies the situation about formation and development of the electron process on the dielectric window surface in high power microwave (HPM) devices. We establish a simple two-dimensional model that the TEM wave irradiates the dielectric window surface vertically with the PIC simulation software VORPAL, employ the Vaughan’s secondary electron emission model, utilize Monte Carlo collision model to deal with the elastic collision, the excitation collision and the ionization collision between electron and background gas, and acquire the electron multipactor images on the dielectric window surface. The simulation results show that the electron number on the dielectric window surface reaches saturation in a period of time and its oscillation frequency is twice as much as that of the incident electric field. Changing the initial emissive number of the seed electrons, the amplitude of the incident electric field and the pressure of the background gas, we can obtain the variation of the electron number on the dielectric window surface in different conditions.
参考文献

[1] Barker R J, Schamiloglu E. High-power microwaves sources and technologies[M]. Beijing: Tsinghua University Press, 2005.

[2] Neuber A, Dickens J, Hemmert D, et al. Window breakdown caused by high-power microwaves[J]. IEEE Trans on Plasma Sci, 1998, 26(3):296-303.

[3] Kishek R A, Lau Y Y. Multipactor discharge on a dielectric[J]. Physical Review Letters, 1998, 80(1):193-196.

[4] Kim H C, Verboncoeur J P. Time-dependent physics of a single-surface multipactor discharge[J]. Physics of Plasmas, 2005, 12:123504.

[5] Sazontov A, Semenov V, Buyanova M, et al. Multipactor discharge on a dielectric surface: Statistical theory and simulation results[J]. Physics of Plasmas, 2005, 12:093501.

[6] 蔡利兵,王建国.介质表面高功率微波击穿的数值模拟[J].物理学报, 2009, 58(5):3268-3273.(Cai Libing, Wang Jianguo. Numerical simulation of the breakdown on HPM dielectric surface. Acta Physica Sinica, 2009, 58(5):3268-3273)

[7] Cheng Guoxin, Liu Lie. Monte Carlo modeling of secondary electron emission and its incorporation in particle simulations of electron-surface interaction[J]. Comput Phys Commun, 2011, 182(6):1295-1303.

[8] 郝西伟,宋佰鹏,张冠军.真空高功率微波介质窗表面击穿破坏现象的研究进展[J].强激光与粒子束, 2012, 24(1):16-23.(Hao Xiwei, Song Baipeng, Zhang Guanjun. Research progress of dielectric window surface breakdown phenomena under HPM in vacuum. High Power Laser and Particle Beams, 2012, 24(1):16-23)

[9] Furman M A, Pivi M T F. Probabilistic model for the simulation of secondary electron emission[J]. Phys Rev ST Accel Beams, 2002, 5:124404.

[10] Vaughan J R M. A new formula for secondary emission yield[J]. IEEE Trans on Electron Devices, 1989, 36:19-63.

[11] Vaughan J R M. Secondary emission formulas[J]. IEEE Trans on Electron Devices, 1993, 40:830.

[12] Vahedi V, Surendra M. Monte Carlo collision model for particle-in-cell method: Application to argon and oxygen discharges[J]. Comput Phys Commun, 1995, 87:179-198.

范壮壮, 王洪广, 林舒, 李永东, 刘纯亮. 高功率微波介质窗表面电子倍增二维粒子模拟[J]. 强激光与粒子束, 2014, 26(6): 063012. Fan Zhuangzhuang, Wang Hongguang, Lin Shu, Li Yongdong, Liu Chunliang. Two dimensional particle-in-cell simulation of electron multipactor on high power microwave dielectric window surface[J]. High Power Laser and Particle Beams, 2014, 26(6): 063012.

本文已被 1 篇论文引用
被引统计数据来源于中国光学期刊网
引用该论文: TXT   |   EndNote

相关论文

加载中...

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!