采用图像诊断方法对高能环形电子束形状及空间尺寸进行了研究，以高能脉冲环形电子束轰击高Z靶材料产生脉冲X射线，X射线经过X射线增感屏转换为可见光，用单次图像采集系统获取可见光的积分图像。为满足诊断所需的空间分辨和系统灵敏度，通过理论计算确立了靶的材料、厚度及X射线增感屏的型号和厚度等参数。根据测试环境，设计了系统的现场安装结构，系统基本满足测试要求。分析从实验中获取的图像，可知环形电子束的内径为36.5 mm，环厚为1 mm，环形不均匀，水平方向电子束强。

The technique and system integration of imaging system to diagnose annular electron beam were introduced. The system is constructed basing on the principle and technology of digital flash X-Ray imaging, the principle is that The X-rays are emitted when the target material by the high energy annular electron beam bombardment, the scintillator converts the X-Ray photons into visible light; the visible light image is recorded by digital imaging system. In order to achieve system sensitivity and spatial resolution, the target material and the maximum target thickness were ascertained by theoretic computing. The measure systems suiting to testing fielded were designed, and the system performance well suited for testing application. The annular electron beam image was acquired; the inner diameter of annular electron beam is 36.5 mm. The electron beam annulus thickness is 1mm, and it is asymmetric.