Photonics Research, 2014, 2 (2): 02000051, Published Online: Nov. 5, 2014
False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments 
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Hui Yan, Jingsong Wei. False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments[J]. Photonics Research, 2014, 2(2): 02000051.
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