发光学报, 2018, 39 (7): 942, 网络出版: 2018-08-30   

MBE法制备VO2薄膜及其中红外调制深度测量

VO2 Thin Films Prepared by MBE and Measurements of Mid-infrared Modulation Depth
刘志伟 1,2,3路远 1,2,3,*侯典心 1,2,3邹崇文 4
作者单位
1 国防科技大学 电子对抗学院, 安徽 合肥 230037
2 红外与低温等离子体安徽省重点实验室, 安徽 合肥 230037
3 脉冲功率激光技术国家重点实验室, 安徽 合肥 230037
4 中国科学技术大学 国家同步辐射实验室, 安徽 合肥 230037
引用该论文

刘志伟, 路远, 侯典心, 邹崇文. MBE法制备VO2薄膜及其中红外调制深度测量[J]. 发光学报, 2018, 39(7): 942.

LIU Zhi-wei, LU Yuan, HOU Dian-xin, ZOU Chong-wen. VO2 Thin Films Prepared by MBE and Measurements of Mid-infrared Modulation Depth[J]. Chinese Journal of Luminescence, 2018, 39(7): 942.

参考文献

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刘志伟, 路远, 侯典心, 邹崇文. MBE法制备VO2薄膜及其中红外调制深度测量[J]. 发光学报, 2018, 39(7): 942. LIU Zhi-wei, LU Yuan, HOU Dian-xin, ZOU Chong-wen. VO2 Thin Films Prepared by MBE and Measurements of Mid-infrared Modulation Depth[J]. Chinese Journal of Luminescence, 2018, 39(7): 942.

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