应用光学, 2008, 29 (6): 0900, 网络出版: 2010-06-03  

用于线路板检测的高分辨率X射线像增强器的研制

Development of high-resolution X-ray image intensifier for inspection of circuit boards
作者单位
1 中国科学院西安光学精密机械研究所 瞬态光学与光子技术国家重点实验室,陕西 西安 710119
2 中国科学院研究生院,北京 100049
引用该论文

曹希斌, 赵宝升, 赛小锋, 韦永林, 李伟, 赵菲菲. 用于线路板检测的高分辨率X射线像增强器的研制[J]. 应用光学, 2008, 29(6): 0900.

CAO Xi-bin, ZHAO Bao-sheng, SAI Xiao-feng, WEI Yong-lin, LI Wei, ZHAO Fei-fei. Development of high-resolution X-ray image intensifier for inspection of circuit boards[J]. Journal of Applied Optics, 2008, 29(6): 0900.

参考文献

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    TIAN Jing-quan,JIANG De-long,SUN Xiu-ping.Study on new MCP reflection X-ray sensitive film of variable density halide [J]. Chinese Journal of Luminescence,2002,23(5):513-516. (in Chinese)

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[7] 邱孟通,王奎禄,王文生,等.一种X射线像增强器能谱响应特性研究[J].核电子学与探测技术,2002,22(3):240-243.

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    LI Ye,JIANG De-long,LU Yao-hua,et al. New advancement of low intensify X-ray imager [J].Journal of Applied Optics. 1999,20 (5) : 12-14. (in Chinese)

曹希斌, 赵宝升, 赛小锋, 韦永林, 李伟, 赵菲菲. 用于线路板检测的高分辨率X射线像增强器的研制[J]. 应用光学, 2008, 29(6): 0900. CAO Xi-bin, ZHAO Bao-sheng, SAI Xiao-feng, WEI Yong-lin, LI Wei, ZHAO Fei-fei. Development of high-resolution X-ray image intensifier for inspection of circuit boards[J]. Journal of Applied Optics, 2008, 29(6): 0900.

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