Analysis and testing of total ionizing dose effect on several commercial optical transceivers via gamma-ray radiation

Yueying Zhan; Jianhua He; Fei Wang; Liqian Wang

doi:doi:10.3788/COL201917.052302

Chinese Optics Letters, 2019, 17 (5): 052302, Published Online: May. 6, 2019

Analysis and testing of total ionizing dose effect on several commercial optical transceivers via gamma-ray radiation Download： 986次

Yueying Zhan ^1,*Jianhua He ¹Fei Wang ²Liqian Wang ³

Author Affiliations

¹ Key Laboratory of Space Utilization, Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China

² AVIC Hisense Photoelectric Technology Co., Ltd., Qingdao 266100, China

³ Beijing University of Posts and Telecommunications, IPOC, Beijing 100876, China

Figures & Tables

Fig. 1. Internal structure diagram of (a) parallel, (b) single-channel, (c) EPON, and (d) chip relationships of transceivers.

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Fig. 2. FPGA block diagram of TID testing.

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Fig. 3. Function diagram of the TID testing board.

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Fig. 4. Diagram of (a) the TID testing environment, (b) the TID test device, and (c) the upper computer software.

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Fig. 5. Current changing of optical modules with the TID.

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Fig. 6. Schematic diagram of upper computer software.

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Fig. 7. Receiver sensitivity of HTS2361, HTS3261, and HTS8566 at different total doses.

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Fig. 8. Eye diagram of (a), (b) HTS3261 at 0 and 50 krad, (c), (d) HTS2361 at 0 and 41 krad, and (e), (f) HTS8566 at 0 and 50 krad.

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Fig. 9. Current changing of the first test board with the total dose in the second testing.

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Fig. 10. Current changing trend of the second board in the second TID testing.

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Fig. 11. Structure of (a) BOSA of the HTS3261, (b) TOSA of HTS8566, and (c) ROSA of HTS8566.

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Fig. 12. Relationship between the thickness of the Al shell and the 10-year dose of LEO aircraft.

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Yueying Zhan, Jianhua He, Fei Wang, Liqian Wang. Analysis and testing of total ionizing dose effect on several commercial optical transceivers via gamma-ray radiation[J]. Chinese Optics Letters, 2019, 17(5): 052302.

Analysis and testing of total ionizing dose effect on several commercial optical transceivers via gamma-ray radiation Download： 986次

Fig. 1. Internal structure diagram of (a) parallel, (b) single-channel, (c) EPON, and (d) chip relationships of transceivers.

Fig. 2. FPGA block diagram of TID testing.

Fig. 3. Function diagram of the TID testing board.

Fig. 4. Diagram of (a) the TID testing environment, (b) the TID test device, and (c) the upper computer software.

Fig. 5. Current changing of optical modules with the TID.

Fig. 6. Schematic diagram of upper computer software.

Fig. 7. Receiver sensitivity of HTS2361, HTS3261, and HTS8566 at different total doses.

Fig. 8. Eye diagram of (a), (b) HTS3261 at 0 and 50 krad, (c), (d) HTS2361 at 0 and 41 krad, and (e), (f) HTS8566 at 0 and 50 krad.

Fig. 9. Current changing of the first test board with the total dose in the second testing.

Fig. 10. Current changing trend of the second board in the second TID testing.

Fig. 11. Structure of (a) BOSA of the HTS3261, (b) TOSA of HTS8566, and (c) ROSA of HTS8566.

Fig. 12. Relationship between the thickness of the Al shell and the 10-year dose of LEO aircraft.

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Analysis and testing of total ionizing dose effect on several commercial optical transceivers via gamma-ray radiation Download： 986次

Fig. 1. Internal structure diagram of (a) parallel, (b) single-channel, (c) EPON, and (d) chip relationships of transceivers.

Fig. 2. FPGA block diagram of TID testing.

Fig. 3. Function diagram of the TID testing board.

Fig. 4. Diagram of (a) the TID testing environment, (b) the TID test device, and (c) the upper computer software.

Fig. 5. Current changing of optical modules with the TID.

Fig. 6. Schematic diagram of upper computer software.

Fig. 7. Receiver sensitivity of HTS2361, HTS3261, and HTS8566 at different total doses.

Fig. 8. Eye diagram of (a), (b) HTS3261 at 0 and 50 krad, (c), (d) HTS2361 at 0 and 41 krad, and (e), (f) HTS8566 at 0 and 50 krad.

Fig. 9. Current changing of the first test board with the total dose in the second testing.

Fig. 10. Current changing trend of the second board in the second TID testing.

Fig. 11. Structure of (a) BOSA of the HTS3261, (b) TOSA of HTS8566, and (c) ROSA of HTS8566.

Fig. 12. Relationship between the thickness of the Al shell and the 10-year dose of LEO aircraft.

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