强激光与粒子束, 2010, 22 (10): 2483, 网络出版: 2010-12-07   

影响高功率脉冲氙灯寿命的因素

Influencing factors of life of high power linear xenon-filled flash lamp
作者单位
中国工程物理研究院 核物理与化学研究所, 四川 绵阳 621900
摘要
以美国NOVA和国家点火装置用的高功率脉冲氙灯为例, 结合对神光Ⅲ装置用脉冲氙灯的分析, 发现了影响脉冲氙灯失效的几个因素, 包括石英灯管应力、氙灯尺寸、灯管微缺陷、电极溅射、灯头绝缘、氙气纯度、封接可靠性及周围氙灯放电。结果发现:在进灯能量相同的情况下, 氙灯电极弧长越长, 内径越大, 寿命越高; 石英灯管表面的静态拉应力、内表面的微缺陷以及周围氙灯的电离辐射使得氙灯的额外负载能量大大增加, 这些是导致氙灯爆炸概率变大的直接因素。
Abstract
This paper analyzes the factors influencing the failures of high power linear xenon-filled flash lamps in NOVA, NIF and Shenguang-Ⅲ. The factors include the correlations between the stress and flash lamp explosion, the correlation between lifetime and lamp size, microdefects of lamp wall, electrode sputtering, insulation, xenon purity, sealing reliability and the increase in energy deposition into flash lamp quartz envelopes caused by the absorption of radiation from neighboring flash lamps. Given the same input energy, the lifetime is longer for the lamp with longer arc length and bigger bore diameter. Direct causes of flash lamp explosion are the surface static tensile stress on the flash lamp quartz envelopes, the microdefects on the inner surface and the increase in energy deposition into flash lamp quartz envelopes caused by the absorption of radiation from neighboring flash lamps.
参考文献

[1] Erlandson A C, Lambert H. The effect of amplifier component maintenance on laser system availability and reliability for the US National Ignition Facility[C]// Proceedings of the Society of Photo-optical Instrumentation Engineers. 1997, 3047:138-147.

[2] Erlandson A C, Gerasimov V A. Flashlamp for NIF: Russian variant[C]//Proceedings of the Society of Photo-optical Instrumentation Engineers. 1997, 3047:627-629.

[3] Nikolaevskii V G, Gerasimov V A. On experience of flashlamps exploitation in high-power Nd-glass lasers for ICF[C]//Proceedings of the Society of Photo-optical Instrumentation Engineers. 1995, 2633:583-586.

[4] 陈光宇, 杨东, 张小民, 等.激光装置片状放大器组件的氙灯可靠性分析[J].强激光与粒子束, 2007, 19(7):1125-1128.(Chen Guangyu,Yang Dong, Zhang Xiaomin, et al. Reliability analysis of Xe-flashlamps of disk amplifier subsystems for laser facility. High Power Laser and Particle Beams, 2007, 19(7):1125-1128)

[5] 方庆华, 吴勇强, 吴仰东.影响脉冲氙灯寿命的因素[J].光电技术, 2004, 45(2/3):33-36.(Fang Qinghua, Wu Yongqiang, Wu Yangdong. Factors of affecting flash lamp life. Electro-optics Technology, 2004, 45(2/3):33-36)

[6] Markiewi J P, Emmett J L. Design of flashlamp driving circuits[J]. IEEE Journal of Quantum Electronics, 1966, 2(11):707-711.

[7] Yoshida k, Yoshiaki K. Prediction of flash lamp explosion by stress measurements[J]. Rev Sci Instr, 1984, 55(9):1415-1420.

[8] Lang K R, Barnes F S. Shock waves in xenon flashtubes and tube deterioration[J]. J Appl Phys, 1964, 35(1):107-110.

[9] Zhu Wenjun, Song Zhengfei, Deng Xiaoliang, et al. Lattice orientation effect on the nano-void growth in copper under shock loading[J]. Phys Rev B, 2007, 75:024104.

[10] Xu Aiguo, Pan X F, Zhang Guangcai. Material-point simulation of cavity collapse under shock[J]. Journal of Physics: Condensed Matter, 2007, 19:326212.

[11] Holian B L, Germann T C, Maillet J B, et al. Atomistic mechanism for hot spot initiation[J]. Phys Rev Lett, 2002, 89:285501.

[12] 邓小良,祝文军,贺红亮,等.〈111〉晶向冲击加载下单晶铜中纳米孔洞增长的早期动力学行为[J].物理学报, 2006, 55(9):4767-4773.(Deng Xiaoliang, Zhu Wenjun, He Hongliang, et al. Initial dynamic behavior of nano-void growth in single-crystal copper under shock loading along 〈111〉 direction. Acta Physica Sinica, 2006, 55(9):4767-4773)

[13] 陈军,经福谦,张景琳,等.冲击作用下金属表面微喷射的分子动力学模拟[J].物理学报, 2002, 51(10):2386-2392.(Chen Jun, Jing Fuqian, Zhang Jinglin, et al. Molecular dynamics simulation of micro particle ejection from a shock-impacted metal surface. Acta Physica Si-nica, 2002, 51(10):2386-2392)

[14] 陈军, 徐云, 陈栋泉,等.冲击作用下纳米孔洞动力学行为的多尺度方法模拟研究[J].物理学报, 2008, 57(10):6437-6443.(Chen Jun, Xu Yun, Chen Dongquan, et al. Multi-scale simulation of the dynamic behaviors of nano-void in shocked material. Acta Physica Sinica, 2008, 57(10):6437-6443)

[15] Rosolowski J H, Charles R J. Wall deterioration in flash lamps[J]. J Appl Phys, 1965, 36:1792-1793.

马永波, 彭述明, 龙兴贵, 符雪梅, 曹清薇, 杨本福, 颜登云. 影响高功率脉冲氙灯寿命的因素[J]. 强激光与粒子束, 2010, 22(10): 2483. Ma Yongbo, Peng Shuming, Long Xinggui, Fu Xuemei, Cao Qingwei, Yang Benfu, Yan Dengyun. Influencing factors of life of high power linear xenon-filled flash lamp[J]. High Power Laser and Particle Beams, 2010, 22(10): 2483.

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