量子电子学报, 2019, 36 (3): 284, 网络出版: 2019-06-17  

一种利用半反半透透镜检验二次非球面的方法

Test Method of conic aspheric surface with semi-transmitting lens
作者单位
1 中国科学院上海技术物理研究所, 上海 200083
2 中国科学院大学, 北京 100049
引用该论文

赵鹏玮, 叶璐, 胡文琦, 郑列华. 一种利用半反半透透镜检验二次非球面的方法[J]. 量子电子学报, 2019, 36(3): 284.

ZHAOPengwei, YE Lu, HU Wenqi, ZHENG Liehua. Test Method of conic aspheric surface with semi-transmitting lens[J]. Chinese Journal of Quantum Electronics, 2019, 36(3): 284.

参考文献

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[2] Kong Xianglei, Hao Peiming, Ding Houyue. The manufacturing of concave aspheric surface with large speed aperture [J]. Chinese Journal of Quantun Electronics (量子电子学报), 2001, 18(1): 50-55 (in Chinese).

[3] Hao Peiming, Li Kexin, Yuan Liyin, et al. Study on resolving anaerrational point of conicoid [J]. Chinese Journal of Quantun Electronics (量子电子学报), 2006, 23(4): 471-475 (in Chinese).

[4] Wang Peng, Zhao Wencai, Hu Mingyong, et al. Hindle testing of the off-axis convex asphere surface [J]. Optics · Precision Engineering (光学 精密工程), 2002, 10(2): 139-142 (in Chinese).

[5] Shen Zhengxiang, Hao Peiming, Zhao Wencai, et al. Autocollimating testing of convex conic aspheric surface [J]. Infrared and Laser Engineering (红外与激光工程), 2005, 34(1): 46-50 (in Chinese).

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赵鹏玮, 叶璐, 胡文琦, 郑列华. 一种利用半反半透透镜检验二次非球面的方法[J]. 量子电子学报, 2019, 36(3): 284. ZHAOPengwei, YE Lu, HU Wenqi, ZHENG Liehua. Test Method of conic aspheric surface with semi-transmitting lens[J]. Chinese Journal of Quantum Electronics, 2019, 36(3): 284.

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