Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq<sub>3</sub> thin films for organic light-emitting diodes application

Fan Zhang; Cong Wang; Kai Yin; Xinran Dong; Yuxin Song; Yaxiang Tian; Ji’an Duan

doi:doi:10.3788/COL201715.111602

Chinese Optics Letters, 2017, 15 (11): 111602, Published Online: Jul. 19, 2018

Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq₃ thin films for organic light-emitting diodes application

Fan Zhang Cong Wang Kai Yin Xinran Dong Yuxin Song Yaxiang Tian Ji’an Duan ^*

Author Affiliations

State Key Laboratory of High Performance and Complex Manufacturing, College of Mechanical and Electrical Engineering, Central South University, Changsha 410083, China

Figures & Tables

Fig. 1. (a) AFM image of the Al-Alq3 sample; (b) schematic diagram of the four-layer structure model applied in the SE data fitting.

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Fig. 2. (Color online) Experimental (dotted lines) and calculated (solid lines) SE data for 40% Al fraction Al-Alq3 thin film at incidence angles 65°, 70°, and 75°.

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Fig. 3. (Color online) (a) Refractive index n and (b) extinction coefficient k of Al-Alq3 thin films with various Al fractions.

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Fig. 4. (Color online) (a) PL spectra of Al-Alq3 thin films with different Al fractions. (b) The resistivity as a function of the Al volume fraction in Al-Alq3 thin films.

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Fan Zhang, Cong Wang, Kai Yin, Xinran Dong, Yuxin Song, Yaxiang Tian, Ji’an Duan. Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq₃ thin films for organic light-emitting diodes application[J]. Chinese Optics Letters, 2017, 15(11): 111602.

Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq₃ thin films for organic light-emitting diodes application

Fig. 1. (a) AFM image of the Al-Alq3 sample; (b) schematic diagram of the four-layer structure model applied in the SE data fitting.

Fig. 2. (Color online) Experimental (dotted lines) and calculated (solid lines) SE data for 40% Al fraction Al-Alq3 thin film at incidence angles 65°, 70°, and 75°.

Fig. 3. (Color online) (a) Refractive index n and (b) extinction coefficient k of Al-Alq3 thin films with various Al fractions.

Fig. 4. (Color online) (a) PL spectra of Al-Alq3 thin films with different Al fractions. (b) The resistivity as a function of the Al volume fraction in Al-Alq3 thin films.

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Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq3 thin films for organic light-emitting diodes application

Fig. 1. (a) AFM image of the Al-Alq3 sample; (b) schematic diagram of the four-layer structure model applied in the SE data fitting.

Fig. 2. (Color online) Experimental (dotted lines) and calculated (solid lines) SE data for 40% Al fraction Al-Alq3 thin film at incidence angles 65°, 70°, and 75°.

Fig. 3. (Color online) (a) Refractive index n and (b) extinction coefficient k of Al-Alq3 thin films with various Al fractions.

Fig. 4. (Color online) (a) PL spectra of Al-Alq3 thin films with different Al fractions. (b) The resistivity as a function of the Al volume fraction in Al-Alq3 thin films.

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Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq₃ thin films for organic light-emitting diodes application