Author Affiliations
Abstract
1 Saint-Petersburg Electrotechnical University "LETI", Saint Petersburg, 197022, Russian Federation
2 Alferov Saint-Petersburg National Research Academic University of the Russian Academy of Sciences, Saint Petersburg, 194021, Russian Federation
3 Saint Petersburg Polytechnic University of Peter the Great, Saint Petersburg, 195251, Russian Federation
4 Shubnikov Institute of Crystallography of Federal Scientific Research Centre “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, 119333, Russian Federation
5 National Research Center ‘Kurchatov Institute’, Moscow, 123182, Russian Federation
6 University associated with IA EAEC, Saint Petersburg, 194044, Russian Federation
7 Institute for Analytical Instrumentation, Saint Petersburg, 198095, Russian Federation
8 Ioffe Institute, Saint Petersburg, 194021, Russian Federation
A new theoretical method to study super-multiperiod superlattices has been developed. The method combines the precision of the 8-band kp-method with the flexibility of the shooting method and the Monte Carlo approach. This method was applied to examine the finest quality samples of super-multiperiod Al0.3Ga0.7As/GaAs superlattices grown by molecular beam epitaxy. The express photoreflectance spectroscopy method was utilized to validate the proposed theoretical method. For the first time, the accurate theoretical analysis of the energy band diagram of super-multiperiod superlattices with experimental verification has been conducted. The proposed approach highly accurately determines transition peak positions and enables the calculation of the energy band diagram, transition energies, relaxation rates, and gain estimation. It has achieved a remarkably low 5% error compared to the commonly used method, which typically results in a 25% error, and allowed to recover the superlattice parameters. The retrieved intrinsic parameters of the samples aligned with XRD data and growth parameters. The proposed method also accurately predicted the escape of the second energy level for quantum well thicknesses less than 5 nm, as was observed in photoreflectance experiments. The new designs of THz light-emitting devices operating at room temperature were suggested by the developed method.
super-multiperiod superlattice photoreflectance spectroscopy Kane model kp-method energy band diagram light amplifiers 
Journal of Semiconductors
2024, 45(2): 022701
林虹宇 1,2谢浩 1,2王洋 1,2陆宏波 1,2[ ... ]戴宁 1,*
作者单位
摘要
1 中国科学院上海技术物理研究所红外物理国家重点实验室, 上海 200083
2 中国科学院大学, 北京 100049
在传统pn结红外探测器中,宽带隙阻挡层的引入可以有效降低器件暗电流。采用COMSOL软件对探测器的能带图进行仿真,结果表明,InAsSbP四元合金通过n型或p型掺杂,其能带结构能够实现价带能级的下凹或导带能级的上凸,起到阻挡空穴或电子的作用。通过理论分析和仿真计算,确定了满足阻挡层要求的InAsSbP组分。对于nBip型和pBin型红外探测器,仿真得到了阻挡层的最优厚度和最优掺杂浓度(粒子数浓度),并分析了其偏离最优值时对器件暗电流的影响。对于nBip型探测器,当阻挡层厚度为40 nm、掺杂浓度为2×10 18 cm -3时,器件开关比最大;对于pBin型探测器,当阻挡层厚度为60 nm、掺杂浓度为4×10 17 cm -3时,器件的开关比最大。
探测器 暗电流 阻挡层 能带图 
光学学报
2019, 39(5): 0504002
作者单位
摘要
Dept. of S. S. Electron., Huazhong University of Sci. and Tech., Wuhan 430074, CHN
Conductivity Energy Band Diagram Nanocrystalline Silicon Film 
半导体光子学与技术
1998, 4(2): 84

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