Yuheng Zeng 1,2,3,*†Zetao Ding 1,2,3†Zunke Liu 1,2,3Wei Liu 1,3[ ... ]Jichun Ye 1,2,3,***
Author Affiliations
Abstract
1 Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
2 University of Chinese Academy of Sciences, Beijing 100049, China
3 Zhejiang Engineering Research Center for Energy Optoelectronic Materials and Devices, Ningbo Institute of Materials Technology & Engineering, CAS, Ningbo 315201, China
4 Zhejiang Energy Group R & D, Hangzhou 310003, China
In this work, we developed a simple and direct circuit model with a dual two-diode model that can be solved by a SPICE numerical simulation to comprehensively describe the monolithic perovskite/crystalline silicon (PVS/c-Si) tandem solar cells. We are able to reveal the effects of different efficiency-loss mechanisms based on the illuminated current density-voltage (J-V), semi-log dark J-V, and local ideality factor (m-V) curves. The effects of the individual efficiency-loss mechanism on the tandem cell’s efficiency are discussed, including the exp(V/VT) and exp(V/2VT) recombination, the whole cell’s and subcell’s shunts, and the Ohmic-contact or Schottky-contact of the intermediate junction. We can also fit a practical J-V curve and find a specific group of parameters by the trial-and-error method. Although the fitted parameters are not a unique solution, they are valuable clues for identifying the efficiency loss with the aid of the cell’s structure and experimental processes. This method can also serve as an open platform for analyzing other tandem solar cells by substituting the corresponding circuit models. In summary, we developed a simple and effective methodology to diagnose the efficiency-loss source of a monolithic PVS/c-Si tandem cell, which is helpful to researchers who wish to adopt the proper approaches to improve their solar cells.
monolithic perovskite/silicon tandem solar cell efficiency-loss analysis dual two-diode model SPICE numerical simulation 
Journal of Semiconductors
2023, 44(8): 082702
作者单位
摘要
西安电子科技大学 物理与光电工程学院,陕西 西安710071
激光晶体由于吸收了一部分泵浦光能量,产生的热量引起晶体内温度不均匀分布,使晶体内的折射率产生不均匀分布,对振荡光产生相应的相位调制,引起振荡光光场再分布,进而导致振荡光模式发生变化。谐振腔具有滤波作用,谐振腔会过滤掉振荡光中与谐振腔不匹配的模式,引起损耗,用MATLAB模拟晶体内温度场分布,通过计算谐振腔内基模的热致损耗及低阶模转换到高阶模的比例,并研究谐振腔中各阶模式的转换问题,为抑制高阶模并减小损耗提供理论依据。
非均匀泵浦 热效应 模式损耗 效能亏损 non-uniform pumping thermal effect mode loss efficiency loss 
应用光学
2019, 40(4): 542
牛晓龙 1,2,*乔松 1,2张莉沫 1,2潘明翠 1,2[ ... ]倪建雄 1,2
作者单位
摘要
1 英利能源(中国)有限公司, 河北 保定 071051
2 光伏材料与技术国家重点实验室, 河北 保定 071051
3 河北流云新能源科技有限公司, 河北 保定071051
利用光致发光技术对两种厚度的多晶硅片进行缺陷检测并分类, 在缺陷比例相同的条件下分析了硅片厚度对太阳电池性能的影响。薄(175 μm)太阳电池在开路电压、短路电流、转换效率方面明显低于同等缺陷的厚(190 μm)电池, 即硅片厚度的降低会引起电池性能的下降。此外, 厚度降低后, 低缺陷硅片的电池效率损失大于高缺陷硅片。
光致发光 多晶硅片 厚度 缺陷比例 效率损失 photoluminescence multicrystalline silicon wafer thickness defect ratio efficiency loss 
光电子技术
2016, 36(1): 55

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