Photonics Research, 2020, 8 (5): 05000755, Published Online: Apr. 26, 2020  

High-performance mid-wavelength InAs avalanche photodiode using AlAs0.13Sb0.87 as the multiplication layer Download: 616次

Author Affiliations
1 Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
3 School of Physics and Astronomy, Cardiff University, Cardiff, UK
4 e-mail: XieS1@cardiff.ac.uk
5 e-mail: wqma@semi.ac.cn
Abstract
We report on a high-performance mid-wavelength infrared avalanche photodetector (APD) with separate absorption and multiplication regions. InAs is used as the absorber material and high-bandgap AlAs0.13Sb0.87 is used as the multiplication material. At room temperature, the APD’s peak response wavelength is 3.27 μm, and the 50% cutoff wavelength is 3.5 μm. The avalanche gain reaches 13.1 and the responsivity is 8.09 A/W at 3.27 μm when the applied reverse bias voltage is 14.6 V. The measured peak detectivity D? of the device is 2.05×109 cm·Hz0.5/W at 3.27 μm.

Jianliang Huang, Chengcheng Zhao, Biying Nie, Shiyu Xie, Dominic C. M. Kwan, Xiao Meng, Yanhua Zhang, Diana L. Huffaker, Wenquan Ma. High-performance mid-wavelength InAs avalanche photodiode using AlAs0.13Sb0.87 as the multiplication layer[J]. Photonics Research, 2020, 8(5): 05000755.

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