Third-order nonlinear optical properties of WTe<sub>2</sub> films synthesized by pulsed laser deposition

Mi He; Yequan Chen; Lipeng Zhu; Huan Wang; Xuefeng Wang; Xinlong Xu; Zhanyu Ren

doi:doi:10.1364/PRJ.7.001493

Photonics Research, 2019, 7 (12): 12001493, Published Online: Nov. 22, 2019

Third-order nonlinear optical properties of WTe₂ films synthesized by pulsed laser deposition Download： 599次

Mi He ¹Yequan Chen ²Lipeng Zhu ³Huan Wang ¹Xuefeng Wang ^2,4,*Xinlong Xu ¹Zhanyu Ren ^1,5,*

Author Affiliations

¹ Shaanxi Joint Laboratory of Graphene, State Key Laboratory Incubation Base of Photoelectric Technology and Functional Materials, International Collaborative Center on Photoelectric Technology and Nano Functional Materials, Institute of Photonics & Photon-Technology, Northwest University, Xi’an 710069, China

² National Laboratory of Solid State Microstructures, Collaborative Innovation Center of Advanced Microstructures, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China

³ School of Electronic Engineering, Xi’an University of Posts and Telecommunications, Xi’an 710121, China

⁴ e-mail: xfwang@nju.edu.cn

⁵ e-mail: rzy@nwu.edu.cn

Figures & Tables

Fig. 1. Optical path diagram of the Z-scan experiment.

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Fig. 2. Characterization of thin WTe2 film. (a) XPS. (b) Raman spectrum. (c) Atomic force microscopy (AFM) image. The step at the edge shows that the thickness of the film is typically ∼70 nm. (d) Absorption curve along with the reference mica substrate.

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Fig. 3. OA Z-scan results of the WTe2 sample deposited on the mica substrate. (a) OA Z-scan result of the WTe2/mica and the mica substrate. (b) Normalized transmission as a function of the WTe2 sample position under different intensities at the focal point. (c) Saturation absorption fitting. (d) Electronic band structures of WTe2. (e) Simplified electronic band model of WTe2. (f) Slow saturation absorption fitting.

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Fig. 4. CA Z-scan results of the WTe2 sample deposited on mica substrate. (a) CA Z-scan result under 15.603 GW/cm2 incident peak power intensity. (b) Nonlinear refractive index and nonlinear phase shift as a function of excitation peak power intensity.

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Fig. 5. First-principles calculation of linear refractive index of WTe2. (a) Linear refractive index. (b) Local image of refractive index.

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Table1. Comparison of Third-Order Nonlinear Coefficients between ${WTe}_{2}$ and Other Two-Dimensional Materials

Sample	$β$ (cm/GW)	$n_{2} ({cm}^{2} / GW)$	$Re χ^{(3)}$ (esu)	$Im χ^{(3)}$ (esu)	$FOM (esu \cdot cm)$	Refs.
${WTe}_{2}$	$- 3.37 \times 10^{3}$	$- 1.629 \times 10^{- 2}$	$- 5.93 \times 10^{- 9}$	$- 1.01 \times 10^{- 8}$	$1.143 \times 10^{- 13}$	This work
${MoS}_{2}$	−3.8	$1.88 \times 10^{- 3}$	$8.71 \times 10^{- 10}$	$- 1.5 \times 10^{- 11}$	—	[56]
${WS}_{2}$	−5.1	$5.83 \times 10^{- 2}$	$2.31 \times 10^{- 8}$	$- 1.75 \times 10^{- 11}$	—	[56]
${MoTe}_{2}$	$- 7.50 \times 10^{- 3}$	$- 0.160 \times 10^{- 3}$	$- 0.92 \times 10^{- 11}$	$- 5.50 \times 10^{- 15}$	$6.38 \times 10^{- 15}$	[58]
Graphene	$- 9.4 \times 10^{- 2}$	$- 13.7 \times 10^{- 3}$	$- 78.2 \times 10^{- 11}$	$- 6.9 \times 10^{- 14}$	$4.03 \times 10^{- 15}$	[58]

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Mi He, Yequan Chen, Lipeng Zhu, Huan Wang, Xuefeng Wang, Xinlong Xu, Zhanyu Ren. Third-order nonlinear optical properties of WTe₂ films synthesized by pulsed laser deposition[J]. Photonics Research, 2019, 7(12): 12001493.

Third-order nonlinear optical properties of WTe₂ films synthesized by pulsed laser deposition Download： 599次

Fig. 1. Optical path diagram of the Z-scan experiment.

Fig. 2. Characterization of thin WTe2 film. (a) XPS. (b) Raman spectrum. (c) Atomic force microscopy (AFM) image. The step at the edge shows that the thickness of the film is typically ∼70 nm. (d) Absorption curve along with the reference mica substrate.

Fig. 4. CA Z-scan results of the WTe2 sample deposited on mica substrate. (a) CA Z-scan result under 15.603 GW/cm2 incident peak power intensity. (b) Nonlinear refractive index and nonlinear phase shift as a function of excitation peak power intensity.

Fig. 5. First-principles calculation of linear refractive index of WTe2. (a) Linear refractive index. (b) Local image of refractive index.

Table1. Comparison of Third-Order Nonlinear Coefficients between ${WTe}_{2}$ and Other Two-Dimensional Materials

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Third-order nonlinear optical properties of WTe2 films synthesized by pulsed laser deposition Download： 599次

Fig. 1. Optical path diagram of the Z-scan experiment.

Fig. 2. Characterization of thin WTe2 film. (a) XPS. (b) Raman spectrum. (c) Atomic force microscopy (AFM) image. The step at the edge shows that the thickness of the film is typically ∼70 nm. (d) Absorption curve along with the reference mica substrate.

Fig. 4. CA Z-scan results of the WTe2 sample deposited on mica substrate. (a) CA Z-scan result under 15.603 GW/cm2 incident peak power intensity. (b) Nonlinear refractive index and nonlinear phase shift as a function of excitation peak power intensity.

Fig. 5. First-principles calculation of linear refractive index of WTe2. (a) Linear refractive index. (b) Local image of refractive index.

Table1. Comparison of Third-Order Nonlinear Coefficients between WTe2 and Other Two-Dimensional Materials

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Third-order nonlinear optical properties of WTe₂ films synthesized by pulsed laser deposition Download： 599次

Table1. Comparison of Third-Order Nonlinear Coefficients between ${WTe}_{2}$ and Other Two-Dimensional Materials