Measurement of the wavelength modulation indices with selective reflection spectroscopy

Liantuan Xiao; Jianming Zhao; Wangbao Yin; Yanting Zhao; Bernard Journet; Suotang Jia

Chinese Optics Letters, 2003, 1 (7): 07426, Published Online: Jun. 6, 2006

Measurement of the wavelength modulation indices with selective reflection spectroscopy Download： 667次

论文大纲

Liantuan Xiao ^1,2,*Jianming Zhao ¹Wangbao Yin ¹Yanting Zhao ¹Bernard Journet ²Suotang Jia ¹

Author Affiliations

¹ State Key Lab of Quantum Optics and Quantum Devices, Department of Electronics &

² Information Technology, Shanxi University, Taiyuan 030006

300.6380 spectroscopy modulation 300.6260 spectroscopy diode lasers 300.6210 spectroscopy atomic 300.3700 linewidth

Abstract

The wavelength modulation indices are measured based on harmonic amplitude ratio of 4f_(amp)/6f_(amp) (4f_(amp) and 6f_(amp) are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-free selective reflection modulation spectroscopy. The experiments for the 6S_(1/2)(F = 4) → 6P_(3/2)(F' = 5) transition of cesium D_(2) line with 30-MHz linewidth were carried out. The 4f- and 6f-harmonic signals were detected with two digital lock-in amplifiers separately. The maximum error for modulation indices measurement was ±0.1 within the range of m from 3 to 6. The non-linear modulation behaviour of an external cavity diode laser induced by voltage tuning was studied with this method. The method for modulation indices measurement does not require a solid etalon as usual for measuring the wavelength modulation depth and the absorption linewidth correspondingly.

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Liantuan Xiao, Jianming Zhao, Wangbao Yin, Yanting Zhao, Bernard Journet, Suotang Jia. Measurement of the wavelength modulation indices with selective reflection spectroscopy[J]. Chinese Optics Letters, 2003, 1(7): 07426.

Measurement of the wavelength modulation indices with selective reflection spectroscopy Download： 667次

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