本文针对列阵元件的特点,提出了对其光谱响应进行整体测试的方法。实测结果与误差分析计算表明,整体测试法是一种准确稳定和易行的方法。

In this paper, a whole-testing method is proposed for the spectral responsivity measurement of array device in accordance with its special features. The experimental results and error analysis have shown that the whole tasting could have high accuracy repeatability and easier to instrument rather than the point-to-point measurements.