光学 精密工程, 2013, 21 (11): 2778, 网络出版: 2014-01-09   

CCD与CMOS图像传感器辐射效应测试系统

Testing system for radiation effects of CCD and CMOS image sensors
李豫东 1,2,*汪波 1,2,3郭旗 1,2玛丽娅 1,2,3任建伟 4
作者单位
1 中国科学院 新疆理化技术研究所, 新疆 乌鲁木齐 830011
2 中国科学院 特殊环境功能材料与器件重点实验室, 新疆 乌鲁木齐 830011
3 中国科学院大学, 北京 100049
4 中国科学院 长春光学精密机械与物理研究所, 吉林 长春 130033
引用该论文

李豫东, 汪波, 郭旗, 玛丽娅, 任建伟. CCD与CMOS图像传感器辐射效应测试系统[J]. 光学 精密工程, 2013, 21(11): 2778.

LI Yu-dong, WANG Bo, GUO Qi, MA Li-ya, REN Jian-wei. Testing system for radiation effects of CCD and CMOS image sensors[J]. Optics and Precision Engineering, 2013, 21(11): 2778.

参考文献

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李豫东, 汪波, 郭旗, 玛丽娅, 任建伟. CCD与CMOS图像传感器辐射效应测试系统[J]. 光学 精密工程, 2013, 21(11): 2778. LI Yu-dong, WANG Bo, GUO Qi, MA Li-ya, REN Jian-wei. Testing system for radiation effects of CCD and CMOS image sensors[J]. Optics and Precision Engineering, 2013, 21(11): 2778.

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