软X射线多层膜反射镜界面粗糙度的一种估算方法
[1] . A. Back, R. L. Kauffman, P. M. Bell et al.. Charcterization of Nova plasmas using an x-ray spectrometer with temporal and spatial resolution[J]. Rev. Sci. Instrum., 1995, 66(1): 764-766.
[2] . L. Shealy, R. B. Hoover, T. W. Barbee, Jr. et al.. Design and analysis of a Schwarzschils imaging multilayer x-ray microscope[J]. Opt. Eng., 1990, 29(7): 721-727.
[3] . Sayre. Potential operating region for ultrasoft x-ray microscopy of biological materials[J]. Science, 1977, 196(4296): 1339-1340.
[4] . B. C. Walker, Jr., J. F. Lindblom, J. G. Timoth et al.. The ultra high resolution XUV spectroheliograph[J]. Opt. Eng., 1990, 29(7): 698-710.
[5] M. Born. Principles of Optics [M]. New York: Pergamon, 3rd, 1965
[6] . Vidal, P. Vincent. Metallic multilayers for x-ray using classical thin-film theory[J]. Appl. Opt., 1984, 23(11): 1794-1801.
[7] J. M. Eastman. In Physics of Thin Films, Advances in Research and Development [M]. Edited by F. Hass, M. H. Francombe. New York: Academic Press, Vol.10, 1978
[8] . G. Sterns. The scattering of x rays from nonideal multiplayer structures[J]. J. Appl. Phys., 1989, 65(2): 491-506.
[9] . M. Eastman, P. Baumeister. The microstructure of polished optical surfaces[J]. Opt. Comm., 1974, 12(4): 418-420.
宋利民, 胡家升. 软X射线多层膜反射镜界面粗糙度的一种估算方法[J]. 中国激光, 2002, 29(3): 236. 宋利民, 胡家升. A Method of Evaluating the Roughness of a Co/C Multi-layer Film[J]. Chinese Journal of Lasers, 2002, 29(3): 236.