光学元件亚表层裂纹成核临界条件研究
[1] 王洪祥, 李成福, 朱本温, 等. 光学元件亚表面缺陷的损伤性检测方法[J]. 强激光与粒子束, 2014,26: 122008. (Wang Hongxiang, Li Chengfu, Zhu Benwen, et al. Destructive detection methods of subsurface defects for fused silica optics. High Power Laser and Particle Beams, 2014,26: 122008)
[2] 王洪祥, 李成福, 周岩, 等. 光学元件兆声辅助化学刻蚀工艺参数优化[J]. 强激光与粒子束, 2015,27: 112010. (Wang Hongxiang, Li Chengfu, Zhou Yan, et al. Process parameters optimization for fused silica optics by megasonic assisted chemical etching. High Power Laser and Particle Beams, 2015,27: 112010)
[3] Marshall D B, Lawn B R, Evans A G. Elastic/plastic indentation damage in ceramics: the lateral crack system[J]. Journal of the American Ceramic Society, 1982, 65(11): 561-566.
[4] Jing X N, Maiti S, Subhash G. A new analytical model for estimation of scratch-induced damage in brittle solids[J]. Journal of the American Ceramic Society, 2007, 90(30): 885-892.
[5] Yoshino M, Ogawa Y, Aravindan S. Machining of hard-brittle materials by a single point tool under external hydrostatic pressure[J]. Transactions of the ASME: Journal of Manufacturing Science and Engineering, 2005, 127(4): 837-845.
[6] Subhash G, Bandyo R. A new scratch resistance measure for structural ceramics[J]. Journal of the American Ceramic Society, 2005, 88(4): 918-925.
[7] Subhash G, Klecka M. Ductile to brittle transition depth during single-grit scratching on alumina ceramics[J]. Journal of American Ceramic Society, 2007, 90(11): 3704-3707.
[8] Sajjadi M, Malekian M, Park S S, et al. Investigation of micro scratching and machining of glass[C]//ASME 2009 International Manufacturing Science and Engineering Conference. 2009: 401-408.
[9] 严志龙.熔石英元件亚表层裂纹形成及深度预测方法研究[D].哈尔滨: 哈尔滨工业大学,2014: 38-42.(Yan Zhilong. Formation mechanisms and depth of subsurface damage prediction for fused silica optics. Harbin: Harbin Institute of Technology, 2014: 38-42)
王洪祥, 王景贺, 严志龙, 周岩, 徐曦, 钟波. 光学元件亚表层裂纹成核临界条件研究[J]. 强激光与粒子束, 2016, 28(4): 041004. Wang Hongxiang, Wang Jinghe, Yan Zhilong, Zhou Yan, Xu Xi, Zhong Bo. Critical condition of subsurface crack formation for optics[J]. High Power Laser and Particle Beams, 2016, 28(4): 041004.