为评估日盲紫外(SBUV)像增强型CCD(ICCD)响应度随工作时间的变化规律，针对器件的两种典型工作模式设计了SBUV-ICCD疲劳特性测试方案，并构建装置对其进行了实验测量。首先结合SBUV-ICCD的基本结构和工作原理介绍了器件的两种工作模式；其次，定义了器件疲劳特性，提出了SBUV-ICCD疲劳性测试方案；最后，对两只SBUV-ICCD进行了疲劳特性测试，并分析了该测试方案的不确定度。实验结果表明：在光电模拟模式和光子计数模式下国内某型号SBUV-ICCD的疲劳特性分别为13%和3%，国外某型号SBUV-ICCD疲劳特性优于1%，本测试方案的不确定度为1%。

To evaluate the evolution of response of solar blind ultraviolet (SBUV) intensified CCD (ICCD) versus working time, a novel fatigue property testing scheme is proposed and actual experiments are carried out for two typical work patterns. At first, two typical working modes for SBUV-ICCD are introduced based on the fundamental construction and principle. Secondly, the device fatigue property is defined and a novel fatigue testing scheme is designed. Finally, fatigue testing for two SBUV-ICCDs is done and their uncertainties are analyzed. The testing results show that the fatigue properties of a homemade SBUV-ICCD in photoelectric simulation mode and photo counting mode are 13% and 3%, respectively, while the corresponding parameters of an abroad SBUV-ICCD are better than 1%, and the scheme′s uncertainty is 1%.