光学学报, 1987, 7 (10): 939, 网络出版: 2011-09-20
用阴极发光显微术研究YAG:Nd3+晶体中的缺陷
Study of defects in YAG: Nd3+ crystals by means of cathodoluminescence micrography
阴极发光显微术 晶体缺陷 YAG:Nd~（3+）晶体 扫描电子显微术 cathodoluminescence microscopy defect in crystal YAG:Nd~（3+） crystal scanning electron microscopy
摘要
采用扫描电子显微镜中的阴极发光显微术获得了YAG:Nd~(3+)激光晶体中不同缺陷所形成的显微发光图象。据此进一步分析了这些缺陷的形成机制及其对材料性能的影响。
Abstract
Using the cathodoluminescence (CL) mode of operation of the scanning electron microscope (SEM), OL images of various defects in YAG:Nd3+ crystals have been obtained. Prther investigation of the formation mechanism of the defects and effects of performances in YAG:Nd3+ crystals has been made according to the OL images.
参考文献
黄德群, 王浩炳, 邓佩珍. 用阴极发光显微术研究YAG:Nd3+晶体中的缺陷[J]. 光学学报, 1987, 7(10): 939. HUANG DEQUN, WANG HAOBING, DENG PEIZHEN. Study of defects in YAG: Nd3+ crystals by means of cathodoluminescence micrography[J]. Acta Optica Sinica, 1987, 7(10): 939.
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