应用光学, 2012, 33 (6): 1069, 网络出版: 2012-12-31  

基于干涉条纹图像对比法测量微位移

Micro-displacement measurement based on comparison of interference fringe
作者单位
河南科技大学 物理与工程学院应用物理系,洛阳市光电功能材料重点实验室, 河南 洛阳 471003
引用该论文

闫海涛, 孟伟东, 赵晓艳, 甄志强. 基于干涉条纹图像对比法测量微位移[J]. 应用光学, 2012, 33(6): 1069.

YAN Hai-tao, MENG Wei-dong, ZHAO Xiao-yan, ZHEN Zhi-qiang. Micro-displacement measurement based on comparison of interference fringe[J]. Journal of Applied Optics, 2012, 33(6): 1069.

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闫海涛, 孟伟东, 赵晓艳, 甄志强. 基于干涉条纹图像对比法测量微位移[J]. 应用光学, 2012, 33(6): 1069. YAN Hai-tao, MENG Wei-dong, ZHAO Xiao-yan, ZHEN Zhi-qiang. Micro-displacement measurement based on comparison of interference fringe[J]. Journal of Applied Optics, 2012, 33(6): 1069.

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