应用光学, 2012, 33 (6): 1069, 网络出版: 2012-12-31
基于干涉条纹图像对比法测量微位移
Micro-displacement measurement based on comparison of interference fringe
补充材料
闫海涛, 孟伟东, 赵晓艳, 甄志强. 基于干涉条纹图像对比法测量微位移[J]. 应用光学, 2012, 33(6): 1069. YAN Hai-tao, MENG Wei-dong, ZHAO Xiao-yan, ZHEN Zhi-qiang. Micro-displacement measurement based on comparison of interference fringe[J]. Journal of Applied Optics, 2012, 33(6): 1069.