Reflective point-dif fraction microscopic interferometer with long-term stability (Invited Paper)

Rongli Guo; Baoli Yao; Peng Gao; Junwei Min; Juanjuan Zheng; Tong Ye

doi:doi:10.3788/col201109.120002

Chinese Optics Letters, 2011, 9 (12): 120002, Published Online: Dec. 15, 2011

Reflective point-dif fraction microscopic interferometer with long-term stability (Invited Paper) Download： 588次

论文大纲

Rongli Guo Baoli Yao Peng Gao Junwei Min Juanjuan Zheng Tong Ye

Author Affiliations

090.2880 Holographic interferometry 180.3170 Interference microscopy 120.3180 Interferometry 120.5050 Phase measurement

Abstract

An on-axis phase-shifting reflective point-diffraction microscopic interferometer for quantitative phase microscopy based on Michelson architecture is proposed. A cube beamsplitter splits the object wave spectrum into two copies within two arms. Reference wave is rebuilt in one arm by low-pass filtering on the object wave frequency spectrum with a pinhole-mask mirror, and interferes with the object wave from the other arm. Polarization phase-shifting is performed and phase imaging on microscale specimens is implemented. The experimental results demonstrate that the proposed scheme has the advantage of long-term stability due to its quasi common-path geometry with full use of laser energy.

References

[1] I. Yamaguchi, J. Kato, S. Ohta, and J. Mizuno, Appl. Opt. 40, 6177 (2001).

[2] Y. X. Wang, D. Y. Wang, J. Zhao, Y. S. Yang, X. Q. Xiao, and H. K. Cui, Chin. Opt. Lett. 9, 030901 (2011).

[3] F. Charri`ere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, Appl. Opt. 45, 829 (2006).

[4] B. Kemper and G. V. Bally, Appl. Opt. 47, A52 (2008).

[5] C. J. Mann, L. Yu, C.-M. Lo, and M. K. Kim, Opt. Express 13, 8693 (2005).

[6] W. J. Qu, C. O. Choo, V. R. Singh, Y. J. Yu, and A. Asundi, Appl. Opt. 49, 6448 (2010).

[7] P. Marquet, B. Rappaz, P. J. Magistretti, E. Cuche, Y. Emery, T. Colomb, and C. Depeursinge, Opt. Lett. 30, 468 (2005).

[8] M. T. Rinehart, N. T. Shaked, N. J. Jenness, R. L. Clark, and A. Wax, Opt. Lett. 35, 2612 (2010).

[9] T. Ikeda, G. Popescu, R. R. Dasari, and M. S. Feld, Opt. Lett. 30, 1165 (2005).

[10] D. Malacara, Optical Shop Testing (3rd edn.) (Wiley, Hoboken, 2007).

[11] F. Zernike, Science 121, 345 (1955).

[12] G. Popescu, T. Ikeda, R. R. Dasari, and M. S. Feld, Opt. Lett. 31, 775 (2006).

[13] Y. Park, G. Popescu, K. Badizadegan, R. R. Dasari, and M. S. Feld, Opt. Express 14, 8263 (2006).

[14] H. Ding and G. Popescu, Opt. Express 18, 1569 (2010).

[15] C. Mercer and K. Creath, Opt. Lett. 19, 916 (1994).

[16] C. Iemmi, A. Moreno, and J. Campos, Opt. Express 13, 1885 (2005).

[17] H. Kadono, T. Nobukatsu, and T. Asakura, Appl. Opt. 26, 898 (1987).

[18] R. M. Neal and J. C.Wyant, Appl. Opt. 35, 3463 (2006).

[19] D. Wang, Y. Yang, C. Chen, and Y. Zhuo, Appl. Opt. 50, 2342 (2011).

[20] P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, Opt. Lett. 35, 712 (2010).

[21] G. Rodriguez-Zurita, C. Meneses-Fabian, N. Toto-Arellano, J. Vazquez-Castillo, and C. Robledo-Sanchez, Opt. Express 16, 7806 (2008).

[22] M. A. Herraez, D. R. Burton, M. J. Lalor, and D. B. Clegg, Appl. Opt. 35, 5847 (1996).

[23] X. F. Meng, L. Z. Cai, X. F. Xu, X. L. Yang, X. X. Shen, G. Y. Dong, and Y. R.Wang, Opt. Lett. 31, 1414 (2006).

[24] J.-P. Liu and T.-C. Poon, Opt. Lett. 34, 250 (2009).

Rongli Guo, Baoli Yao, Peng Gao, Junwei Min, Juanjuan Zheng, Tong Ye. Reflective point-dif fraction microscopic interferometer with long-term stability (Invited Paper)[J]. Chinese Optics Letters, 2011, 9(12): 120002.

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