红外焦平面探测器的光谱一致性是评价材料制备水平的重要参数之一。探测器材料因制备工艺的不同而存在差异。由于光谱仪光斑尺寸的限制、探测器杜瓦结构的局限性以及设备采集光谱的巨大数据量，难以对探测器组件的光谱一致性进行测试分析。为此提出了一种新方法，即选取用传统工艺和优化工艺制备的两种探测器样品，并选取成像图中与工艺相关的多个明暗特征区域，再测试这些区域的光谱曲线并对其进行分析汇总，然后通过比较光谱最大差异来评判探测器光谱一致性的优劣。该方法测得两种探测器特征区域的光谱最大差异分别为1.21μm和0.30μm。测试结果表明，优化工艺后的光谱一致性优于传统工艺。

The spectral consistency of infrared focal plane detector is one of the important parameters to evaluate the level of material preparation. The detector materials are different because of different preparation processes. Due to the limitations of the speckle size of the spectrometer and the dewar structure of the detector, as well as the huge amount of spectral data collected by the device, it is difficult to test and analyze the detector components. A new method is proposed in this paper. Two detector samples prepared by traditional and optimized process are selected, and multiple light and dark feature regions in the images related to the process are chosen. Then the spectral curves of these regions are tested, analyzed and summarized. And the maximum spectral differences are compared to judge the spectral consistency. The maximum spectral difference of the two materials are 1.21μm and 0.30μm. The results show that the spectral consistency of the optimized process is better than that of the traditional process.