多角度偏振成像仪面阵探测器筛选及测试方法 下载: 1547次
Screening and Testing Method of Area Detectors for Directional Polarimetric Camera
姚萍萍 1,2许孙龙 1,2涂碧海 1,2,**崔珊珊 1,2金洁 1,2骆冬根 1,2,*洪津 1,2,***
1 中国科学院安徽光学精密机械研究所, 安徽 合肥 230031
2 中国科学院通用光学定标与表征技术重点实验室, 安徽 合肥 230031
图 & 表
图 1. DPC成像系统示意图
Fig. 1. Structural diagram of DPC imaging system
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图 2. 面阵CCD的图像采集系统框图
Fig. 2. Schematic of area CCD image acquisition system
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图 3. 面阵CCD的环境应力筛选试验流程
Fig. 3. Flow chart of environmental stress screening test for area CCD
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图 4. 温度循环中探测器的安装图
Fig. 4. Installation image of CCD for temperature cycling
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图 5. 温度循环试验现场图
Fig. 5. Site map for thermal cycling test
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图 6. 随机振动试验测点布置图。(a) X向;(b) Y向;(c) Z向;(d)探测器坐标系
Fig. 6. Measuring point layout of random vibration. (a) X direction; (b) Y direction; (c) Z direction; (d) detector coordinate
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图 7. 面阵CCD的高温老练测试系统装置
Fig. 7. Equipment of burn-in test of array CCD
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图 8. 面阵CCD的光电性能测试系统示意图
Fig. 8. Schematic of electro-optical test system of array CCD
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图 9. 筛选前后的量子效率曲线变化图
Fig. 9. QE before and after screening
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表 1筛选试验前后面阵CCD光电性能合格要求
Table1. Criteria of electro-optical tests of array CCD before and after screening
Parameter | Criterion |
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Dark current | ≤5516 electron·(pixel·s-1)-1 @5.5 ℃ | Number of white spots | ≤50 @5.5 ℃ | Number of black spots | ≤50 @5.5 ℃ | PRNU | ≤3% @490,670,865 nm | Non-linear error | ≤1% @490,670,865 nm | Quantum efficiency | Va≤±5% before andafter screening when spectral response range is 400-940 nm with resolution of 3 nm |
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表 2CCD探测器筛选前后的光电性能参数
Table2. Photoelectric performance parameters of CCD detector before and after screening
Parameter | Wavelength /nm | Before screening | After screening | Delta value | Pass or Fail |
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Dark current | | 1041.38 /[ electron·(pixel·s-1)-1] | 889.22 /[ electron·(pixel·s-1)-1] | - | Pass | Number of white spots andblack spots | | 0 | 0 | - | Pass | | 490 | 2.35% | 2.23% | - | Pass | PRNU | 670 | 2.13% | 2.12% | - | Pass | | 865 | 2.51% | 2.34% | - | Pass | | 490 | 0.58% | 0.28% | - | Pass | Linearity error | 670 | 0.35% | 0.24% | - | Pass | | 865 | 0.43% | 0.12% | - | Pass | | 400 | 57.3% | 55.87% | -2.56% | Pass | | 443 | 77.98% | 78.03% | 0.06% | Pass | | 490 | 89.32% | 89.58% | 0.29% | Pass | | 500 | 90.7% | 90.99% | 0.32% | Pass | QE | 566 | 94.04% | 94.5% | 0.49% | Pass | | 670 | 87.69% | 88.5% | 0.92% | Pass | | 764 | 67.81% | 67.91% | 0.15% | Pass | | 865 | 39.08% | 39.25% | 0.43% | Pass | | 900 | 28.6% | 28.51% | -0.32% | Pass | | 910 | 25.94% | 25.82% | -0.46% | Pass |
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表 3探测器性能优选结果
Table3. Performance optimization results of detectors
Serial No. | Dark current /[electron·(pixel·s-1)-1] | Max PRNU /% | Max linearityerror /% | Max delta valueof QE /% |
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11 | 983.87 | 2.62 | 0.30 | 3.34 | 33 | 1147.06 | 2.55 | 0.69 | -4.15 | 55 | 889.22 | 2.34 | 0.28 | -2.56 | 77 | 1163.2 | 2.33 | 0.29 | 3.54 | 99 | 1498.2 | 2.75 | 0.54 | 3.81 |
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姚萍萍, 许孙龙, 涂碧海, 崔珊珊, 金洁, 骆冬根, 洪津. 多角度偏振成像仪面阵探测器筛选及测试方法[J]. 光学学报, 2020, 40(11): 1112002. Pingping Yao, Sunlong Xu, Bihai Tu, Shanshan Cui, Jie Jin, Donggen Luo, Jin Hong. Screening and Testing Method of Area Detectors for Directional Polarimetric Camera[J]. Acta Optica Sinica, 2020, 40(11): 1112002.